Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research
Premises of solution errors in Poisson’s equation describing field electron emission system. / Egorov, N.; Ivanova, K.
2016 14th International Baltic Conference on Atomic Layer Deposition (BALD). Institute of Electrical and Electronics Engineers Inc., 2016. p. 44-46.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research
}
TY - GEN
T1 - Premises of solution errors in Poisson’s equation describing field electron emission system
AU - Egorov, N.
AU - Ivanova, K.
N1 - N. Egorov and K. Ivanova, "Premises of solution errors in Poisson's equation describing field electron emission system," 2016 14th International Baltic Conference on Atomic Layer Deposition (BALD), 2016, pp. 44-46, doi: 10.1109/BALD.2016.7886534.
PY - 2016
Y1 - 2016
N2 - Field electron emission systems are described by the Poissons equation for electrostatic potential. For the simple vacuum microdiode, consisting of the cathode and the anode, it is supposed that input data of equation have inherent errors of measurements. Numerical solution of a two-dimensional Poisson equation together with Dirichlet boundary conditions is reduced to the solution of an interval system of linear algebraic equations. The algorithm of two-sided estimation of an error of solution is formalized on two point-wise matrices of the system by the analysis of scalar component-wise product of elements of a matrix and their cofactors.
AB - Field electron emission systems are described by the Poissons equation for electrostatic potential. For the simple vacuum microdiode, consisting of the cathode and the anode, it is supposed that input data of equation have inherent errors of measurements. Numerical solution of a two-dimensional Poisson equation together with Dirichlet boundary conditions is reduced to the solution of an interval system of linear algebraic equations. The algorithm of two-sided estimation of an error of solution is formalized on two point-wise matrices of the system by the analysis of scalar component-wise product of elements of a matrix and their cofactors.
UR - https://ieeexplore.ieee.org/document/7886534
M3 - Conference contribution
SN - 978-1-5090-3416-1
SP - 44
EP - 46
BT - 2016 14th International Baltic Conference on Atomic Layer Deposition (BALD)
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016
Y2 - 1 October 2016 through 3 October 2016
ER -
ID: 7656725