DOI

Article proposed novel method of automatic sketch synthesis, that can be used for creating test databases and sketch recognition tasks research and retrieval of corresponding photo. These methods were applied to two popular benchmark face databases. It was shown that for recognition of sketches very simple systems can be used.

Translated title of the contributionSketch generation from photo to create test databases
Original languagePolish
Pages (from-to)97-100
Number of pages4
JournalPrzeglad Elektrotechniczny
Volume90
Issue number2
DOIs
StatePublished - 1 Jan 2014

    Research areas

  • Face photo-sketch comparison, Sketch recognition system, Sketch synthesis, Two-dimensional principal component analysis

    Scopus subject areas

  • Electrical and Electronic Engineering

ID: 49225207