• R. W.E. Van De Kruijs
  • H. Fredrikze
  • M. Th Rekveldt
  • A. A. Van Well
  • Yu V. Nikitenko
  • V. G. Syromyatnikov

In this work we present a full data analysis of polarized neutron reflectometry experiments on a thin magnetic film. A magnetic field was applied perpendicular to the layer magnetization, resulting in non spin-flip and spin-flip reflectivities. For moderate external fields, the gain or loss of Zeeman energy for spin-flipped neutrons results in off-specular reflected spin-flipped beams. The theoretical model used to explain all data simultaneously consists of a bulk cobalt layer, together with interfacial layers with low magnetization values.

Original languageEnglish
Pages (from-to)189-193
Number of pages5
JournalPhysica B: Condensed Matter
Volume283
Issue number1-3
DOIs
StatePublished - Jun 2000
Event6th International Conference on Surface X-ray and Neutron Scattering (SXNS-6) - Noordwijkerhout, Neth
Duration: 12 Sep 199917 Sep 1999

    Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

ID: 86505689