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Photoelectron Diffraction and Holography Studies of 2D Materials and Interfaces. / Kuznetsov, Mikhail; Ogorodnikov, Ilya I.; Usachov, Dmitry Yu; Laubschat, Clemens; Vyalikh, Denis V.; Matsui, Fumihiko; Yashina, Lada.

In: Journal of the Physical Society of Japan, Vol. 87, No. 6, 061005-1, 15.06.2018.

Research output: Contribution to journal › Article › peer-review

Harvard

Kuznetsov, M, Ogorodnikov, II, Usachov, DY, Laubschat, C, Vyalikh, DV, Matsui, F & Yashina, L 2018, 'Photoelectron Diffraction and Holography Studies of 2D Materials and Interfaces', Journal of the Physical Society of Japan, vol. 87, no. 6, 061005-1. https://doi.org/10.7566/JPSJ.87.061005

APA

Kuznetsov, M., Ogorodnikov, I. I., Usachov, D. Y., Laubschat, C., Vyalikh, D. V., Matsui, F., & Yashina, L. (2018). Photoelectron Diffraction and Holography Studies of 2D Materials and Interfaces. Journal of the Physical Society of Japan, 87(6), [061005-1]. https://doi.org/10.7566/JPSJ.87.061005

Vancouver

Kuznetsov M, Ogorodnikov II, Usachov DY, Laubschat C, Vyalikh DV, Matsui F et al. Photoelectron Diffraction and Holography Studies of 2D Materials and Interfaces. Journal of the Physical Society of Japan. 2018 Jun 15;87(6). 061005-1. https://doi.org/10.7566/JPSJ.87.061005

Author

Kuznetsov, Mikhail ; Ogorodnikov, Ilya I. ; Usachov, Dmitry Yu ; Laubschat, Clemens ; Vyalikh, Denis V. ; Matsui, Fumihiko ; Yashina, Lada. / Photoelectron Diffraction and Holography Studies of 2D Materials and Interfaces. In: Journal of the Physical Society of Japan. 2018 ; Vol. 87, No. 6.

BibTeX

@article{9250a4ad91ae47b8b14a137b4fc5f93d,
title = "Photoelectron Diffraction and Holography Studies of 2D Materials and Interfaces",
abstract = "Photoelectron diffraction (XPD) and holography (XPH) are powerful spectroscopic methods that allow comprehensive exploration and characterization of certain structural properties of materials in particular those of 2D systems and interfaces. Recent developments in XPD and XPH are especially impressive when they are applied to partially disordered systems such as intercalation compounds, doped graphene, buffer layers or adsorbates and imperfectly ordered germanene and phoshporene. In our brief review, we sum up the advances in XPD and XPH studies of 2D materials and discuss the unique opportunities granted by these two interrelated methods.",
keywords = "HEXAGONAL BORON-NITRIDE, ADSORBATE STRUCTURE DETERMINATION, LOCAL ATOMIC-STRUCTURE, MULTIPLE-SCATTERING, AUGER-ELECTRON, STRUCTURAL-ANALYSIS, SURFACE-STRUCTURE, FINE-STRUCTURE, SOURCE WAVE, RAY",
author = "Mikhail Kuznetsov and Ogorodnikov, {Ilya I.} and Usachov, {Dmitry Yu} and Clemens Laubschat and Vyalikh, {Denis V.} and Fumihiko Matsui and Lada Yashina",
year = "2018",
month = jun,
day = "15",
doi = "10.7566/JPSJ.87.061005",
language = "Английский",
volume = "87",
journal = "Journal of the Physical Society of Japan",
issn = "0031-9015",
publisher = "Physical Society of Japan",
number = "6",

}

RIS

TY - JOUR

T1 - Photoelectron Diffraction and Holography Studies of 2D Materials and Interfaces

AU - Kuznetsov, Mikhail

AU - Ogorodnikov, Ilya I.

AU - Usachov, Dmitry Yu

AU - Laubschat, Clemens

AU - Vyalikh, Denis V.

AU - Matsui, Fumihiko

AU - Yashina, Lada

PY - 2018/6/15

Y1 - 2018/6/15

N2 - Photoelectron diffraction (XPD) and holography (XPH) are powerful spectroscopic methods that allow comprehensive exploration and characterization of certain structural properties of materials in particular those of 2D systems and interfaces. Recent developments in XPD and XPH are especially impressive when they are applied to partially disordered systems such as intercalation compounds, doped graphene, buffer layers or adsorbates and imperfectly ordered germanene and phoshporene. In our brief review, we sum up the advances in XPD and XPH studies of 2D materials and discuss the unique opportunities granted by these two interrelated methods.

AB - Photoelectron diffraction (XPD) and holography (XPH) are powerful spectroscopic methods that allow comprehensive exploration and characterization of certain structural properties of materials in particular those of 2D systems and interfaces. Recent developments in XPD and XPH are especially impressive when they are applied to partially disordered systems such as intercalation compounds, doped graphene, buffer layers or adsorbates and imperfectly ordered germanene and phoshporene. In our brief review, we sum up the advances in XPD and XPH studies of 2D materials and discuss the unique opportunities granted by these two interrelated methods.

KW - HEXAGONAL BORON-NITRIDE

KW - ADSORBATE STRUCTURE DETERMINATION

KW - LOCAL ATOMIC-STRUCTURE

KW - MULTIPLE-SCATTERING

KW - AUGER-ELECTRON

KW - STRUCTURAL-ANALYSIS

KW - SURFACE-STRUCTURE

KW - FINE-STRUCTURE

KW - SOURCE WAVE

KW - RAY

UR - http://www.scopus.com/inward/record.url?scp=85046889931&partnerID=8YFLogxK

UR - http://www.mendeley.com/research/photoelectron-diffraction-holography-studies-2d-materials-interfaces

U2 - 10.7566/JPSJ.87.061005

DO - 10.7566/JPSJ.87.061005

M3 - статья

VL - 87

JO - Journal of the Physical Society of Japan

JF - Journal of the Physical Society of Japan

SN - 0031-9015

IS - 6

M1 - 061005-1

ER -

ID: 33792674