Phase coexistence in Y - and La -doped Hf0.5Zr0.5O2 thin films and its effect on the electrical properties in functional capacitors › SPbU Researchers Portal

Phase coexistence in Y - and La -doped Hf0.5Zr0.5O2 thin films and its effect on the electrical properties in functional capacitors

Research output: Contribution to journal › Article › peer-review

Department of Solid State Electronics

Links

https://link.aps.org/doi/10.1103/ph5z-qf5l

DOI

https://doi.org/10.1103/ph5z-qf5l
Final published version

Anna G. Chernikova
Aleksei S. Konashuk
Leonid L. Lev
Roman R. Khakimov
Ratibor G. Chumakov
Aleksey M. Lebedev
Elena O. Filatova
Maxim G. Kozodaev
Sergei S. Zarubin
Evgeny V. Korostylev
Andrei M. Markeev
Andrei V. Zenkevich

Original language	English
Article number	024081
Journal	Physical Review Applied
Volume	25
Issue number	2
DOIs	https://doi.org/10.1103/ph5z-qf5l
State	Published - 25 Feb 2026

Scopus subject areas

Physics and Astronomy(all)

ID: 149504312