DOI

A method is described for oscillographic recording of single-shot nanosecond processes on the basis of electron-optical converters, and parameter measurements are reported for shockwaves in pulsed loading of materials by a high-current electron beam.

Original languageEnglish
Pages (from-to)1038-1040
Number of pages3
JournalMeasurement Techniques
Volume39
Issue number10
DOIs
StatePublished - Oct 1996

    Scopus subject areas

  • Instrumentation
  • Applied Mathematics

ID: 61413766