Morphological evolution in heteroepitaxial thin film structures at the nanoscale

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Morphological evolution in heteroepitaxial thin film structures at the nanoscale. / Grekov, M.A.; Kostyrko, S.A.

In: Diffusion and Defect Data. Pt A Defect and Diffusion Forum, Vol. 364, 2015, p. 112-121.

Research output: Contribution to journal › Article › peer-review

BibTeX

@article{0abffd93def14004990aae870a68a531,

title = "Morphological evolution in heteroepitaxial thin film structures at the nanoscale",

abstract = "The aim of this study is to resolve the phenomenon of formation of mesoscopic structures on the surface of heteroepitaxial thin film system due to surface diffusion by considering the effects of both surface and interface stresses. Elastic stress field caused by curved surface is solved by using the constitutive equations of linear elasticity for the bulk and surface phases. Based on the method of superposition, a boundary perturbation technique, Goursat-Kolosov complex potentials and Muskhelishvili representations, the boundary value problem is reduced to the successive solution of a system of singular and hypersingular integral equations for any order of approximation. This solution and thermodynamic approach allows us to derive a governing equation which gives the amplitude changing of a surface roughness with time.",

keywords = "thin film, surface diffusion, morphological instability, size effect, surface elasticity",

author = "M.A. Grekov and S.A. Kostyrko",

year = "2015",

doi = "10.4028/www.scientific.net/DDF.364.112",

language = "English",

volume = "364",

pages = "112--121",

journal = "Defect and Diffusion Forum",

issn = "1012-0386",

publisher = "Trans Tech Publications Ltd",

}

RIS

TY - JOUR

T1 - Morphological evolution in heteroepitaxial thin film structures at the nanoscale

AU - Grekov, M.A.

AU - Kostyrko, S.A.

PY - 2015

Y1 - 2015

N2 - The aim of this study is to resolve the phenomenon of formation of mesoscopic structures on the surface of heteroepitaxial thin film system due to surface diffusion by considering the effects of both surface and interface stresses. Elastic stress field caused by curved surface is solved by using the constitutive equations of linear elasticity for the bulk and surface phases. Based on the method of superposition, a boundary perturbation technique, Goursat-Kolosov complex potentials and Muskhelishvili representations, the boundary value problem is reduced to the successive solution of a system of singular and hypersingular integral equations for any order of approximation. This solution and thermodynamic approach allows us to derive a governing equation which gives the amplitude changing of a surface roughness with time.

AB - The aim of this study is to resolve the phenomenon of formation of mesoscopic structures on the surface of heteroepitaxial thin film system due to surface diffusion by considering the effects of both surface and interface stresses. Elastic stress field caused by curved surface is solved by using the constitutive equations of linear elasticity for the bulk and surface phases. Based on the method of superposition, a boundary perturbation technique, Goursat-Kolosov complex potentials and Muskhelishvili representations, the boundary value problem is reduced to the successive solution of a system of singular and hypersingular integral equations for any order of approximation. This solution and thermodynamic approach allows us to derive a governing equation which gives the amplitude changing of a surface roughness with time.

KW - thin film

KW - surface diffusion

KW - morphological instability

KW - size effect

KW - surface elasticity

UR - https://www.scientific.net/DDF.364.112

U2 - 10.4028/www.scientific.net/DDF.364.112

DO - 10.4028/www.scientific.net/DDF.364.112

M3 - Article

VL - 364

SP - 112

EP - 121

JO - Defect and Diffusion Forum

JF - Defect and Diffusion Forum

SN - 1012-0386

ER -

ID: 3927183