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Mode localization and eigenfrequency curve veerings of two overhanged beams. / Zhang, Yin; Petrov, Yuri; Zhao, Ya Pu.

In: Micromachines, Vol. 12, No. 3, 324, 19.03.2021.

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Zhang, Yin ; Petrov, Yuri ; Zhao, Ya Pu. / Mode localization and eigenfrequency curve veerings of two overhanged beams. In: Micromachines. 2021 ; Vol. 12, No. 3.

BibTeX

@article{79d4916d45e143ffbdbb458b38c05092,
title = "Mode localization and eigenfrequency curve veerings of two overhanged beams",
abstract = "Overhang provides a simple but effective way of coupling (sub)structures, which has been widely adopted in the applications of optomechanics, electromechanics, mass sensing resonators, etc. Despite its simplicity, an overhanging structure demonstrates rich and complex dynamics such as mode splitting, localization and eigenfrequency veering. When an eigenfrequency veering occurs, two eigenfrequencies are very close to each other, and the error associated with the numerical discretization procedure can lead to wrong and unphysical computational results. A method of computing the eigenfrequency of two overhanging beams, which involves no numerical discretization procedure, is analytically derived. Based on the method, the mode localization and eigenfrequency veering of the overhanging beams are systematically studied and their variation patterns are summarized. The effects of the overhang geometry and beam mechanical properties on the eigenfrequency veering are also identified.",
keywords = "Eigenfrequency curve veering, Mode localization, Mode splitting, Overhang, overhang, mode localization, eigenfrequency curve veering, mode splitting",
author = "Yin Zhang and Yuri Petrov and Zhao, {Ya Pu}",
note = "Publisher Copyright: {\textcopyright} 2021 by the authors. Licensee MDPI, Basel, Switzerland. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.",
year = "2021",
month = mar,
day = "19",
doi = "10.3390/mi12030324",
language = "English",
volume = "12",
journal = "Micromachines",
issn = "2072-666X",
publisher = "MDPI AG",
number = "3",

}

RIS

TY - JOUR

T1 - Mode localization and eigenfrequency curve veerings of two overhanged beams

AU - Zhang, Yin

AU - Petrov, Yuri

AU - Zhao, Ya Pu

N1 - Publisher Copyright: © 2021 by the authors. Licensee MDPI, Basel, Switzerland. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.

PY - 2021/3/19

Y1 - 2021/3/19

N2 - Overhang provides a simple but effective way of coupling (sub)structures, which has been widely adopted in the applications of optomechanics, electromechanics, mass sensing resonators, etc. Despite its simplicity, an overhanging structure demonstrates rich and complex dynamics such as mode splitting, localization and eigenfrequency veering. When an eigenfrequency veering occurs, two eigenfrequencies are very close to each other, and the error associated with the numerical discretization procedure can lead to wrong and unphysical computational results. A method of computing the eigenfrequency of two overhanging beams, which involves no numerical discretization procedure, is analytically derived. Based on the method, the mode localization and eigenfrequency veering of the overhanging beams are systematically studied and their variation patterns are summarized. The effects of the overhang geometry and beam mechanical properties on the eigenfrequency veering are also identified.

AB - Overhang provides a simple but effective way of coupling (sub)structures, which has been widely adopted in the applications of optomechanics, electromechanics, mass sensing resonators, etc. Despite its simplicity, an overhanging structure demonstrates rich and complex dynamics such as mode splitting, localization and eigenfrequency veering. When an eigenfrequency veering occurs, two eigenfrequencies are very close to each other, and the error associated with the numerical discretization procedure can lead to wrong and unphysical computational results. A method of computing the eigenfrequency of two overhanging beams, which involves no numerical discretization procedure, is analytically derived. Based on the method, the mode localization and eigenfrequency veering of the overhanging beams are systematically studied and their variation patterns are summarized. The effects of the overhang geometry and beam mechanical properties on the eigenfrequency veering are also identified.

KW - Eigenfrequency curve veering

KW - Mode localization

KW - Mode splitting

KW - Overhang

KW - overhang

KW - mode localization

KW - eigenfrequency curve veering

KW - mode splitting

UR - http://www.scopus.com/inward/record.url?scp=85103493518&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/3ec7ab90-9b97-3564-9d82-d3f27a729c99/

U2 - 10.3390/mi12030324

DO - 10.3390/mi12030324

M3 - Article

AN - SCOPUS:85103493518

VL - 12

JO - Micromachines

JF - Micromachines

SN - 2072-666X

IS - 3

M1 - 324

ER -

ID: 76243952