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Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods. / Blagov, A. E.; Marchenkov, N. V.; Pisarevsky, Yu V.; Prosekov, P. A.; Kovalchuk, M. V.

In: Crystallography Reports, Vol. 58, No. 1, 01.2013, p. 49-53.

Research output: Contribution to journal › Article › peer-review

Harvard

Blagov, AE, Marchenkov, NV, Pisarevsky, YV, Prosekov, PA & Kovalchuk, MV 2013, 'Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods', Crystallography Reports, vol. 58, no. 1, pp. 49-53. https://doi.org/10.1134/S1063774513010057

APA

Blagov, A. E., Marchenkov, N. V., Pisarevsky, Y. V., Prosekov, P. A., & Kovalchuk, M. V. (2013). Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods. Crystallography Reports, 58(1), 49-53. https://doi.org/10.1134/S1063774513010057

Vancouver

Blagov AE, Marchenkov NV, Pisarevsky YV, Prosekov PA, Kovalchuk MV. Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods. Crystallography Reports. 2013 Jan;58(1):49-53. https://doi.org/10.1134/S1063774513010057

Author

Blagov, A. E. ; Marchenkov, N. V. ; Pisarevsky, Yu V. ; Prosekov, P. A. ; Kovalchuk, M. V. / Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods. In: Crystallography Reports. 2013 ; Vol. 58, No. 1. pp. 49-53.

BibTeX

@article{4c8260439c324a8f97a3697568368726,
title = "Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods",
abstract = "A method for measuring piezoelectric constants of crystals of intermediate systems by X-ray quasi-multiple-wave diffraction is proposed and implemented. This technique makes it possible to determine the piezoelectric coefficient by measuring variations in the lattice parameter under an external electric field. This method has been approved, its potential is evaluated, and a comparison with high-resolution X-ray diffraction data is performed.",
author = "Blagov, {A. E.} and Marchenkov, {N. V.} and Pisarevsky, {Yu V.} and Prosekov, {P. A.} and Kovalchuk, {M. V.}",
note = "Funding Information: ACKNOWLEDGMENTS This study was supported by the Ministry of Educa tion and Science of the Russian Federation, state con tract nos. 16.518.11.7026 and 16.740.11.0095; the Russian Foundation for Basic Research, project no. 12 02 31387mol_a; and the Program of Fundamental Research of the Presidium of the Russian Academy of Sciences no. 24 (subprogram 3.1).",
year = "2013",
month = jan,
doi = "10.1134/S1063774513010057",
language = "English",
volume = "58",
pages = "49--53",
journal = "Crystallography Reports",
issn = "1063-7745",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "1",

}

RIS

TY - JOUR

T1 - Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods

AU - Blagov, A. E.

AU - Marchenkov, N. V.

AU - Pisarevsky, Yu V.

AU - Prosekov, P. A.

AU - Kovalchuk, M. V.

N1 - Funding Information: ACKNOWLEDGMENTS This study was supported by the Ministry of Educa tion and Science of the Russian Federation, state con tract nos. 16.518.11.7026 and 16.740.11.0095; the Russian Foundation for Basic Research, project no. 12 02 31387mol_a; and the Program of Fundamental Research of the Presidium of the Russian Academy of Sciences no. 24 (subprogram 3.1).

PY - 2013/1

Y1 - 2013/1

N2 - A method for measuring piezoelectric constants of crystals of intermediate systems by X-ray quasi-multiple-wave diffraction is proposed and implemented. This technique makes it possible to determine the piezoelectric coefficient by measuring variations in the lattice parameter under an external electric field. This method has been approved, its potential is evaluated, and a comparison with high-resolution X-ray diffraction data is performed.

AB - A method for measuring piezoelectric constants of crystals of intermediate systems by X-ray quasi-multiple-wave diffraction is proposed and implemented. This technique makes it possible to determine the piezoelectric coefficient by measuring variations in the lattice parameter under an external electric field. This method has been approved, its potential is evaluated, and a comparison with high-resolution X-ray diffraction data is performed.

UR - http://www.scopus.com/inward/record.url?scp=84873839226&partnerID=8YFLogxK

U2 - 10.1134/S1063774513010057

DO - 10.1134/S1063774513010057

M3 - Article

AN - SCOPUS:84873839226

VL - 58

SP - 49

EP - 53

JO - Crystallography Reports

JF - Crystallography Reports

SN - 1063-7745

IS - 1

ER -

ID: 88210977