The method of holographic interferometry with the increased sensitivity was applied for measurements of height of nano-steps (from 10 nm and higher) with standard uncertainty about 0.5 nm. The increasing of sensitivity is obtained by interference of waves with mutually complex conjugated phases.

Original languageEnglish
Title of host publicationProceedings - 2014 International Conference Laser Optics, LO 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479938858
DOIs
StatePublished - 2014
Event2014 International Conference Laser Optics, LO 2014 - St. Petersburg, Russian Federation
Duration: 30 Jun 20144 Jul 2014

Publication series

NameProceedings - 2014 International Conference Laser Optics, LO 2014

Conference

Conference2014 International Conference Laser Optics, LO 2014
Country/TerritoryRussian Federation
CitySt. Petersburg
Period30/06/144/07/14

    Scopus subject areas

  • Electronic, Optical and Magnetic Materials

    Research areas

  • dynamic holography, holographic intereferometry, liquid crystal, spatial light modulator

ID: 4743153