Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
The method of holographic interferometry with the increased sensitivity was applied for measurements of height of nano-steps (from 10 nm and higher) with standard uncertainty about 0.5 nm. The increasing of sensitivity is obtained by interference of waves with mutually complex conjugated phases.
Original language | English |
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Title of host publication | Proceedings - 2014 International Conference Laser Optics, LO 2014 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Print) | 9781479938858 |
DOIs | |
State | Published - 2014 |
Event | 2014 International Conference Laser Optics, LO 2014 - St. Petersburg, Russian Federation Duration: 30 Jun 2014 → 4 Jul 2014 |
Name | Proceedings - 2014 International Conference Laser Optics, LO 2014 |
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Conference | 2014 International Conference Laser Optics, LO 2014 |
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Country/Territory | Russian Federation |
City | St. Petersburg |
Period | 30/06/14 → 4/07/14 |
ID: 4743153