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Low-energy electron mean free path in thin films of copper phthalocyanine. / Komolov, SA; Lazneva, EF; Komolov, AS.

In: Technical Physics Letters, Vol. 29, No. 12, 2003, p. 974-976.

Research output: Contribution to journal › Article › peer-review

Harvard

Komolov, SA, Lazneva, EF & Komolov, AS 2003, 'Low-energy electron mean free path in thin films of copper phthalocyanine', Technical Physics Letters, vol. 29, no. 12, pp. 974-976.

APA

Komolov, SA., Lazneva, EF., & Komolov, AS. (2003). Low-energy electron mean free path in thin films of copper phthalocyanine. Technical Physics Letters, 29(12), 974-976.

Vancouver

Komolov SA, Lazneva EF, Komolov AS. Low-energy electron mean free path in thin films of copper phthalocyanine. Technical Physics Letters. 2003;29(12):974-976.

Author

Komolov, SA ; Lazneva, EF ; Komolov, AS. / Low-energy electron mean free path in thin films of copper phthalocyanine. In: Technical Physics Letters. 2003 ; Vol. 29, No. 12. pp. 974-976.

BibTeX

@article{719f3275bdbb42e38b4e7dfa7a2a512d,
title = "Low-energy electron mean free path in thin films of copper phthalocyanine",
abstract = "The formation of thin organic films of copper phthalocyanine (CuPc) deposited onto the surface of gold-coated quartz crystal resonator was studied in situ under ultrahigh vacuum conditions by means of total electron-beam-induced current spectroscopy in combination with deposit thickness determination by piezocrystal microbalance technique. Variations in the fine structure of the total current spectra of CuPc layers of various thicknesses in the 0-8 nm interval have been analyzed and the electron mean free path in thin CuPc films was determined as a function of the electron energy. For electron energies of 5.0, 7.2, 14.4, and 18.0 eV above the Fermi level, the mean free path is 6.4, 3.9, 2.6, and 2.3 nm. (C) 2003 MAIK {"}Nauka / Interperiodica{"}.",
keywords = "INTERFACE FORMATION, SURFACES",
author = "SA Komolov and EF Lazneva and AS Komolov",
year = "2003",
language = "Английский",
volume = "29",
pages = "974--976",
journal = "Technical Physics Letters",
issn = "1063-7850",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "12",

}

RIS

TY - JOUR

T1 - Low-energy electron mean free path in thin films of copper phthalocyanine

AU - Komolov, SA

AU - Lazneva, EF

AU - Komolov, AS

PY - 2003

Y1 - 2003

N2 - The formation of thin organic films of copper phthalocyanine (CuPc) deposited onto the surface of gold-coated quartz crystal resonator was studied in situ under ultrahigh vacuum conditions by means of total electron-beam-induced current spectroscopy in combination with deposit thickness determination by piezocrystal microbalance technique. Variations in the fine structure of the total current spectra of CuPc layers of various thicknesses in the 0-8 nm interval have been analyzed and the electron mean free path in thin CuPc films was determined as a function of the electron energy. For electron energies of 5.0, 7.2, 14.4, and 18.0 eV above the Fermi level, the mean free path is 6.4, 3.9, 2.6, and 2.3 nm. (C) 2003 MAIK "Nauka / Interperiodica".

AB - The formation of thin organic films of copper phthalocyanine (CuPc) deposited onto the surface of gold-coated quartz crystal resonator was studied in situ under ultrahigh vacuum conditions by means of total electron-beam-induced current spectroscopy in combination with deposit thickness determination by piezocrystal microbalance technique. Variations in the fine structure of the total current spectra of CuPc layers of various thicknesses in the 0-8 nm interval have been analyzed and the electron mean free path in thin CuPc films was determined as a function of the electron energy. For electron energies of 5.0, 7.2, 14.4, and 18.0 eV above the Fermi level, the mean free path is 6.4, 3.9, 2.6, and 2.3 nm. (C) 2003 MAIK "Nauka / Interperiodica".

KW - INTERFACE FORMATION

KW - SURFACES

M3 - статья

VL - 29

SP - 974

EP - 976

JO - Technical Physics Letters

JF - Technical Physics Letters

SN - 1063-7850

IS - 12

ER -

ID: 18881535