Standard

Inversion Procedures for Bound–Free Diatomic Transition Intensities. Application to the PFOODR Spectra of ^7Li_2. / Ivanov, V. S.; Sovkov, V. B.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3090, 1997, p. 150—156.

Research output: Contribution to journal › Article › peer-review

Harvard

Ivanov, VS & Sovkov, VB 1997, 'Inversion Procedures for Bound–Free Diatomic Transition Intensities. Application to the PFOODR Spectra of ^7Li_2.', Proceedings of SPIE - The International Society for Optical Engineering, vol. 3090, pp. 150—156.

APA

Ivanov, V. S., & Sovkov, V. B. (1997). Inversion Procedures for Bound–Free Diatomic Transition Intensities. Application to the PFOODR Spectra of ^7Li_2. Proceedings of SPIE - The International Society for Optical Engineering, 3090, 150—156.

Vancouver

Ivanov VS, Sovkov VB. Inversion Procedures for Bound–Free Diatomic Transition Intensities. Application to the PFOODR Spectra of ^7Li_2. Proceedings of SPIE - The International Society for Optical Engineering. 1997;3090:150—156.

Author

Ivanov, V. S. ; Sovkov, V. B. / Inversion Procedures for Bound–Free Diatomic Transition Intensities. Application to the PFOODR Spectra of ^7Li_2. In: Proceedings of SPIE - The International Society for Optical Engineering. 1997 ; Vol. 3090. pp. 150—156.

BibTeX

@article{cb454f996ccf40ac8d7ee20dab3f32f7,
title = "Inversion Procedures for Bound–Free Diatomic Transition Intensities. Application to the PFOODR Spectra of ^7Li_2.",
author = "Ivanov, {V. S.} and Sovkov, {V. B.}",
year = "1997",
language = "English",
volume = "3090",
pages = "150—156",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

RIS

TY - JOUR

T1 - Inversion Procedures for Bound–Free Diatomic Transition Intensities. Application to the PFOODR Spectra of ^7Li_2.

AU - Ivanov, V. S.

AU - Sovkov, V. B.

PY - 1997

Y1 - 1997

M3 - Article

VL - 3090

SP - 150—156

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -

ID: 5423439