Interface formation between Be and W layers depending on its thickness and ordering

Research output: Contribution to journal › Article › peer-review

DOI

https://doi.org/doi.org/10.1016/j.apsusc.2020.147636
Final published version

In the present work, formation of interfaces in the W/Be layered structures was studied using X-ray photoelectron spectroscopy. Chemical composition and significance of the interfaces depending on the thickness and ordering of beryllium and tungsten layers were investigated by means of the XPS spectra decomposition technique. The formation of tungsten beryllides WBe2 and WBe12 at the W-on-Be and Be-on-W interfaces, respectively, was revealed. The thickness of WBe2 beryllide does not depend on the thickness of a tungsten top layer, whereas WBe12 thickness increases with increasing Be top layer thickness. Additionally, oxidation of a Be layer under a thin W layer was established and possible mechanism underlying this process was proposed.

Original language	English
Article number	147636
Pages (from-to)	147636
Number of pages	7
Journal	Applied Surface Science
Volume	534
Early online date	25 Aug 2020
DOIs	https://doi.org/doi.org/10.1016/j.apsusc.2020.147636
State	Published - 30 Dec 2020

Scopus subject areas

Condensed Matter Physics
Physics and Astronomy(all)
Surfaces, Coatings and Films
Chemistry(all)
Surfaces and Interfaces

Research areas

X-ray photoelectron spectroscopy, Peak fitting, Thin films, Chemical states, Be/W and W/Be oxidation mechanisms, MULTILAYER MIRRORS, STABILITY, BERYLLIUM-OXIDE, FILMS, X-RAY, TUNGSTEN, XPS, RANGE

ID: 61630758