PbSe and In films with surface areas of 3 × 3 mm ² and thicknesses of 1-1.5 μm were consecutively deposited on substrates made of glass of S-29 grade using the vacuum deposition method. The films were oxidized in the dry air atmosphere at a temperature of 550°C. The possibility of forming whisker nanocrystals (1 - x)In ₂O ₃ · xSeO ₂ on glass substrates was demonstrated. The results of X-ray microanalysis demonstrated the presence of not only lead and indium selenide, but also (1 - x)In ₂O ₃ · xSeO ₂, PbSeO ₃, PbO and SeO ₂ on the surfaces of the films under study.