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Graphite oxide Auger-electron diagnostics. / Mikoushkin, V. M.; Kriukov, A. S.; Shnitov, V. V.; Solonitsyna, A. P.; Fedorov, V. Yu; Dideykin, A. T.; Sakseev, D. A.; Vilkov, O. Yu; Lavchiev, V. M.

In: Journal of Electron Spectroscopy and Related Phenomena, Vol. 199, 2015, p. 51-55.

Research output: Contribution to journal › Article › peer-review

Harvard

Mikoushkin, VM, Kriukov, AS, Shnitov, VV, Solonitsyna, AP, Fedorov, VY, Dideykin, AT, Sakseev, DA, Vilkov, OY & Lavchiev, VM 2015, 'Graphite oxide Auger-electron diagnostics', Journal of Electron Spectroscopy and Related Phenomena, vol. 199, pp. 51-55. https://doi.org/10.1016/j.elspec.2015.01.001

APA

Mikoushkin, V. M., Kriukov, A. S., Shnitov, V. V., Solonitsyna, A. P., Fedorov, V. Y., Dideykin, A. T., Sakseev, D. A., Vilkov, O. Y., & Lavchiev, V. M. (2015). Graphite oxide Auger-electron diagnostics. Journal of Electron Spectroscopy and Related Phenomena, 199, 51-55. https://doi.org/10.1016/j.elspec.2015.01.001

Vancouver

Mikoushkin VM, Kriukov AS, Shnitov VV, Solonitsyna AP, Fedorov VY, Dideykin AT et al. Graphite oxide Auger-electron diagnostics. Journal of Electron Spectroscopy and Related Phenomena. 2015;199:51-55. https://doi.org/10.1016/j.elspec.2015.01.001

Author

Mikoushkin, V. M. ; Kriukov, A. S. ; Shnitov, V. V. ; Solonitsyna, A. P. ; Fedorov, V. Yu ; Dideykin, A. T. ; Sakseev, D. A. ; Vilkov, O. Yu ; Lavchiev, V. M. / Graphite oxide Auger-electron diagnostics. In: Journal of Electron Spectroscopy and Related Phenomena. 2015 ; Vol. 199. pp. 51-55.

BibTeX

@article{ec2f80226ef64c36a3ddbd4d459df348,
title = "Graphite oxide Auger-electron diagnostics",
abstract = "Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (COH) and epoxide (COC). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.",
keywords = "AES, Chemical composition, Epoxide, Graphite oxide, Hydroxyl, XPS",
author = "Mikoushkin, {V. M.} and Kriukov, {A. S.} and Shnitov, {V. V.} and Solonitsyna, {A. P.} and Fedorov, {V. Yu} and Dideykin, {A. T.} and Sakseev, {D. A.} and Vilkov, {O. Yu} and Lavchiev, {V. M.}",
year = "2015",
doi = "10.1016/j.elspec.2015.01.001",
language = "English",
volume = "199",
pages = "51--55",
journal = "Journal of Electron Spectroscopy and Related Phenomena",
issn = "0368-2048",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Graphite oxide Auger-electron diagnostics

AU - Mikoushkin, V. M.

AU - Kriukov, A. S.

AU - Shnitov, V. V.

AU - Solonitsyna, A. P.

AU - Fedorov, V. Yu

AU - Dideykin, A. T.

AU - Sakseev, D. A.

AU - Vilkov, O. Yu

AU - Lavchiev, V. M.

PY - 2015

Y1 - 2015

N2 - Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (COH) and epoxide (COC). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.

AB - Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (COH) and epoxide (COC). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.

KW - AES

KW - Chemical composition

KW - Epoxide

KW - Graphite oxide

KW - Hydroxyl

KW - XPS

UR - http://www.scopus.com/inward/record.url?scp=84923239950&partnerID=8YFLogxK

U2 - 10.1016/j.elspec.2015.01.001

DO - 10.1016/j.elspec.2015.01.001

M3 - Article

AN - SCOPUS:84923239950

VL - 199

SP - 51

EP - 55

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

SN - 0368-2048

ER -

ID: 9291372