Goodness-of-fit tests for the logistic location family

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Goodness-of-fit tests for the logistic location family. / Nikitin, Ya.Yu.; Ragozin, I.A.

In: Journal of Applied Statistics, Vol. 47, No. 13-15, 17.11.2020, p. 2610-2622.

Research output: Contribution to journal › Article › peer-review

Author

Nikitin, Ya.Yu. ; Ragozin, I.A. / Goodness-of-fit tests for the logistic location family. In: Journal of Applied Statistics. 2020 ; Vol. 47, No. 13-15. pp. 2610-2622.

BibTeX

@article{bd61685fe2604829a32eb3648ebdfe73,

title = "Goodness-of-fit tests for the logistic location family",

abstract = "We construct two U-empirical tests for the logistic location family which are based on appropriate characterization of this family using independent exponential shifts. We study the limiting distributions and local Bahadur efficiency of corresponding test statistics under close alternatives. It turns out that the present tests are considerably more efficient than the recently proposed similar tests based on another characterization. The efficiency calculations are accompanied by the simulation of power for new tests together with the previous ones.Both efficiency and power turn out to be very high. Finally we consider the application of our tests to real data example.",

keywords = "exponential distribution, U-statistic, Efficiency, characterization of distributions, Kolmogorov tests, logistic distribution, U-statistics, Bahadur efficiency, characterization, Kolmogorov tests, Kolmogorov test, Logistic distribution",

author = "Ya.Yu. Nikitin and I.A. Ragozin",

note = "Publisher Copyright: {\textcopyright} 2020 Informa UK Limited, trading as Taylor & Francis Group.",

year = "2020",

month = nov,

day = "17",

doi = "DOI:10.1080/02664763.2020.1761952",

language = "English",

volume = "47",

pages = "2610--2622",

journal = "Journal of Applied Statistics",

issn = "0266-4763",

publisher = "Taylor & Francis",

number = "13-15",

}

RIS

TY - JOUR

T1 - Goodness-of-fit tests for the logistic location family

AU - Nikitin, Ya.Yu.

AU - Ragozin, I.A.

PY - 2020/11/17

Y1 - 2020/11/17

N2 - We construct two U-empirical tests for the logistic location family which are based on appropriate characterization of this family using independent exponential shifts. We study the limiting distributions and local Bahadur efficiency of corresponding test statistics under close alternatives. It turns out that the present tests are considerably more efficient than the recently proposed similar tests based on another characterization. The efficiency calculations are accompanied by the simulation of power for new tests together with the previous ones.Both efficiency and power turn out to be very high. Finally we consider the application of our tests to real data example.

AB - We construct two U-empirical tests for the logistic location family which are based on appropriate characterization of this family using independent exponential shifts. We study the limiting distributions and local Bahadur efficiency of corresponding test statistics under close alternatives. It turns out that the present tests are considerably more efficient than the recently proposed similar tests based on another characterization. The efficiency calculations are accompanied by the simulation of power for new tests together with the previous ones.Both efficiency and power turn out to be very high. Finally we consider the application of our tests to real data example.

KW - exponential distribution

KW - U-statistic

KW - Efficiency

KW - characterization of distributions

KW - Kolmogorov tests

KW - logistic distribution

KW - U-statistics

KW - Bahadur efficiency

KW - characterization

KW - Kolmogorov tests

KW - Kolmogorov test

KW - Logistic distribution

UR - https://www.tandfonline.com/action/showAxaArticles?journalCode=cjas20

UR - http://www.scopus.com/inward/record.url?scp=85084345843&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/ddadbc90-31f9-3112-afd3-bd7129b0951f/

U2 - DOI:10.1080/02664763.2020.1761952

DO - DOI:10.1080/02664763.2020.1761952

M3 - Article

VL - 47

SP - 2610

EP - 2622

JO - Journal of Applied Statistics

JF - Journal of Applied Statistics

SN - 0266-4763

IS - 13-15

ER -

ID: 53651245