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Four-parameter model of thin surface layer contribution to reflectance-absorbance spectroscopy and ellipsometry

Research output: Contribution to journal › Article › peer-review

Department of Laser Chemistry

DOI

https://doi.org/10.1364/OE.514646
Final published version

Original language	English
Pages (from-to)	6619-6629
Number of pages	11
Journal	Optics Express
Volume	32
Issue number	4
DOIs	https://doi.org/10.1364/OE.514646
State	Published - 8 Feb 2024

ID: 116992607