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Formation of Xe2 molecules in glow gas discharge. / Kleymenov, E.Yu.; Klemeshev, S.A.; Saveliev, P.A.; Kryukov, N.A.

In: Journal of Physics: Conference Series, Vol. 397, No. 1, 2012, p. 012036_1-5.

Research output: Contribution to journal › Article › peer-review

Harvard

Kleymenov, EY, Klemeshev, SA, Saveliev, PA & Kryukov, NA 2012, 'Formation of Xe2 molecules in glow gas discharge', Journal of Physics: Conference Series, vol. 397, no. 1, pp. 012036_1-5. https://doi.org/10.1088/1742-6596/397/1/012036

APA

Kleymenov, E. Y., Klemeshev, S. A., Saveliev, P. A., & Kryukov, N. A. (2012). Formation of Xe2 molecules in glow gas discharge. Journal of Physics: Conference Series, 397(1), 012036_1-5. https://doi.org/10.1088/1742-6596/397/1/012036

Vancouver

Kleymenov EY, Klemeshev SA, Saveliev PA, Kryukov NA. Formation of Xe2 molecules in glow gas discharge. Journal of Physics: Conference Series. 2012;397(1):012036_1-5. https://doi.org/10.1088/1742-6596/397/1/012036

Author

Kleymenov, E.Yu. ; Klemeshev, S.A. ; Saveliev, P.A. ; Kryukov, N.A. / Formation of Xe2 molecules in glow gas discharge. In: Journal of Physics: Conference Series. 2012 ; Vol. 397, No. 1. pp. 012036_1-5.

BibTeX

@article{8a509d1aa94c4d42b0780b6470fe3435,
title = "Formation of Xe2 molecules in glow gas discharge",
abstract = "Rate constants of formation of Xe2 excimers in the first excited 0+u and 1u molecular states were measured in low-presser (5-12 Torr) low-current (3 mA) glow discharge in neat xenon. Concentrations of the lowest excited 0+u and 1u molecular states were measured with vacuum ultraviolet emission spectroscopy in the wavelength region 147-220 nm. Concentrations of the respective excited atomic states were estimated with infrared absorption at the Xe electronic transition wavelengths 881.9 nm and 828.0 nm. The formation rate constants Kf (0^+_u) = 4*10^(−32) cm^6/s and Kf (1_u) = 0.3*10^(−32) cm^6/s were obtained from a pressure dependence of the atomic and molecular concentrations.",
author = "E.Yu. Kleymenov and S.A. Klemeshev and P.A. Saveliev and N.A. Kryukov",
year = "2012",
doi = "10.1088/1742-6596/397/1/012036",
language = "English",
volume = "397",
pages = "012036_1--5",
journal = "Journal of Physics: Conference Series",
issn = "1742-6588",
publisher = "IOP Publishing Ltd.",
number = "1",

}

RIS

TY - JOUR

T1 - Formation of Xe2 molecules in glow gas discharge

AU - Kleymenov, E.Yu.

AU - Klemeshev, S.A.

AU - Saveliev, P.A.

AU - Kryukov, N.A.

PY - 2012

Y1 - 2012

N2 - Rate constants of formation of Xe2 excimers in the first excited 0+u and 1u molecular states were measured in low-presser (5-12 Torr) low-current (3 mA) glow discharge in neat xenon. Concentrations of the lowest excited 0+u and 1u molecular states were measured with vacuum ultraviolet emission spectroscopy in the wavelength region 147-220 nm. Concentrations of the respective excited atomic states were estimated with infrared absorption at the Xe electronic transition wavelengths 881.9 nm and 828.0 nm. The formation rate constants Kf (0^+_u) = 4*10^(−32) cm^6/s and Kf (1_u) = 0.3*10^(−32) cm^6/s were obtained from a pressure dependence of the atomic and molecular concentrations.

AB - Rate constants of formation of Xe2 excimers in the first excited 0+u and 1u molecular states were measured in low-presser (5-12 Torr) low-current (3 mA) glow discharge in neat xenon. Concentrations of the lowest excited 0+u and 1u molecular states were measured with vacuum ultraviolet emission spectroscopy in the wavelength region 147-220 nm. Concentrations of the respective excited atomic states were estimated with infrared absorption at the Xe electronic transition wavelengths 881.9 nm and 828.0 nm. The formation rate constants Kf (0^+_u) = 4*10^(−32) cm^6/s and Kf (1_u) = 0.3*10^(−32) cm^6/s were obtained from a pressure dependence of the atomic and molecular concentrations.

U2 - 10.1088/1742-6596/397/1/012036

DO - 10.1088/1742-6596/397/1/012036

M3 - Article

VL - 397

SP - 012036_1-5

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

ER -

ID: 5486319