To use efficiently the magnetic functionalities emerging at the surfaces or interfaces of novel lanthanides-based materials, there is a need for complementary methods to probe the atomic-layer resolved magnetic properties. Here, we show that 4f photoelectron spectroscopy is highly sensitive to the collective orientation of 4f magnetic moments and, thus, a powerful tool for characterizing the related properties. To demonstrate this, we present the results of systematic study of a family of layered crystalline 4f-materials, which are crystallized in the body-centered tetragonal ThCr2Si2 structure. Analysis of 4f spectra indicates that the 4f moments at the surface experience a strong reorientation with respect to the bulk, caused by changes of the crystal-electric field. The presented database of the computed 4f spectra for all trivalent rare-earth ions in their different MJ states will facilitate the estimation of the orientation of the 4f magnetic moments in the layered 4f-systems for efficient control of their magnetic properties.