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Enhanced surface sensitivity of X-ray photoelectron holography through the example of Bi2Te3(1 1 1) surface. / Ogorodnikov, Ilya I.; Kuznetsov, Mikhail V.; Matsui, Fumihiko; Usachov, Dmitry Yu.; Yashina, Lada V.

In: Applied Surface Science, Vol. 505, 144531, 01.03.2020.

Research output: Contribution to journalArticlepeer-review

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APA

Ogorodnikov, I. I., Kuznetsov, M. V., Matsui, F., Usachov, D. Y., & Yashina, L. V. (2020). Enhanced surface sensitivity of X-ray photoelectron holography through the example of Bi2Te3(1 1 1) surface. Applied Surface Science, 505, [144531]. https://doi.org/10.1016/j.apsusc.2019.144531

Vancouver

Author

Ogorodnikov, Ilya I. ; Kuznetsov, Mikhail V. ; Matsui, Fumihiko ; Usachov, Dmitry Yu. ; Yashina, Lada V. / Enhanced surface sensitivity of X-ray photoelectron holography through the example of Bi2Te3(1 1 1) surface. In: Applied Surface Science. 2020 ; Vol. 505.

BibTeX

@article{d827d1bf8f824a2a9595ebbf7072f32a,
title = "Enhanced surface sensitivity of X-ray photoelectron holography through the example of Bi2Te3(1 1 1) surface",
abstract = "X-ray photoelectron holography (XPH) is new tool in surface science capable to visualize in real space coordination of the atom of interest (emitter). To study surface phenomena the ultimate and variable (in the range of 1–5 ML) surface sensitivity is needed. Here we discuss possibilities to improve surface sensitivity of XPH by the example of Bi2Se3 (1 1 1) surface where different coordinations of the same kind of atoms are present in different layers. To reach ultimate surface sensitivity we used both lower electron kinetic energy and partial analysis of hologram related to grazing angle photoemission. Using calculations of diffraction patterns based on EDAC code and reverse reconstruction of the real space within SPEA-MEM formalism we evaluate the contribution of each atomic layer into diffraction pattern and found that the surface relaxation could be directly visualised at the kinetic energy less than 100 eV, whereas the contribution of the second quintuple layer can be vanished at 200 eV or below. The same effect can be achieved by partial analysis of hologram at grazing detection angles more than 55° to the surface normal. This approach enables broader practical applications of the XPH to various materials in applied surface science.",
keywords = "Photoelectron holography, Surface structure, ATOMIC-STRUCTURE",
author = "Ogorodnikov, {Ilya I.} and Kuznetsov, {Mikhail V.} and Fumihiko Matsui and Usachov, {Dmitry Yu.} and Yashina, {Lada V.}",
year = "2020",
month = mar,
day = "1",
doi = "10.1016/j.apsusc.2019.144531",
language = "English",
volume = "505",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Enhanced surface sensitivity of X-ray photoelectron holography through the example of Bi2Te3(1 1 1) surface

AU - Ogorodnikov, Ilya I.

AU - Kuznetsov, Mikhail V.

AU - Matsui, Fumihiko

AU - Usachov, Dmitry Yu.

AU - Yashina, Lada V.

PY - 2020/3/1

Y1 - 2020/3/1

N2 - X-ray photoelectron holography (XPH) is new tool in surface science capable to visualize in real space coordination of the atom of interest (emitter). To study surface phenomena the ultimate and variable (in the range of 1–5 ML) surface sensitivity is needed. Here we discuss possibilities to improve surface sensitivity of XPH by the example of Bi2Se3 (1 1 1) surface where different coordinations of the same kind of atoms are present in different layers. To reach ultimate surface sensitivity we used both lower electron kinetic energy and partial analysis of hologram related to grazing angle photoemission. Using calculations of diffraction patterns based on EDAC code and reverse reconstruction of the real space within SPEA-MEM formalism we evaluate the contribution of each atomic layer into diffraction pattern and found that the surface relaxation could be directly visualised at the kinetic energy less than 100 eV, whereas the contribution of the second quintuple layer can be vanished at 200 eV or below. The same effect can be achieved by partial analysis of hologram at grazing detection angles more than 55° to the surface normal. This approach enables broader practical applications of the XPH to various materials in applied surface science.

AB - X-ray photoelectron holography (XPH) is new tool in surface science capable to visualize in real space coordination of the atom of interest (emitter). To study surface phenomena the ultimate and variable (in the range of 1–5 ML) surface sensitivity is needed. Here we discuss possibilities to improve surface sensitivity of XPH by the example of Bi2Se3 (1 1 1) surface where different coordinations of the same kind of atoms are present in different layers. To reach ultimate surface sensitivity we used both lower electron kinetic energy and partial analysis of hologram related to grazing angle photoemission. Using calculations of diffraction patterns based on EDAC code and reverse reconstruction of the real space within SPEA-MEM formalism we evaluate the contribution of each atomic layer into diffraction pattern and found that the surface relaxation could be directly visualised at the kinetic energy less than 100 eV, whereas the contribution of the second quintuple layer can be vanished at 200 eV or below. The same effect can be achieved by partial analysis of hologram at grazing detection angles more than 55° to the surface normal. This approach enables broader practical applications of the XPH to various materials in applied surface science.

KW - Photoelectron holography

KW - Surface structure

KW - ATOMIC-STRUCTURE

UR - http://www.scopus.com/inward/record.url?scp=85076237346&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/f5069652-73be-3baa-8769-02c840637ae1/

U2 - 10.1016/j.apsusc.2019.144531

DO - 10.1016/j.apsusc.2019.144531

M3 - Article

AN - SCOPUS:85076237346

VL - 505

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

M1 - 144531

ER -

ID: 53964899