Research output: Contribution to journal › Article › peer-review
Electronic spectrum of Bi2Sr2CaCu2O8 near the Fermi level from results of numerical calculations and ultraviolet (8.43 eV) photoelectron spectroscopy. / Aprelev, A. M.; Lisachenko, A. A.
In: Technical Physics Letters, Vol. 24, No. 2, 01.01.1998, p. 112-114.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Electronic spectrum of Bi2Sr2CaCu2O8 near the Fermi level from results of numerical calculations and ultraviolet (8.43 eV) photoelectron spectroscopy
AU - Aprelev, A. M.
AU - Lisachenko, A. A.
PY - 1998/1/1
Y1 - 1998/1/1
N2 - The structure of the spectrum of the partial density of filled states of Bi2Sr2CaCu2O8 in the range Eb<4 eV, obtained by ultraviolet (hv= 8.43 eV) photoelectron spectroscopy was compared with that calculated by the strong coupling method. The results of the calculations agree with the experimental results in the range of binding energies 1<Eb<4 eV. Analysis of the evolution of the spectra under thermal and phototreatment in ultrahigh vacuum and in oxygen reveals that oxygen atoms from Cu-O planes possess the highest mobility in the lattice and the surface of the single crystal is formed by Bi-O planes.
AB - The structure of the spectrum of the partial density of filled states of Bi2Sr2CaCu2O8 in the range Eb<4 eV, obtained by ultraviolet (hv= 8.43 eV) photoelectron spectroscopy was compared with that calculated by the strong coupling method. The results of the calculations agree with the experimental results in the range of binding energies 1<Eb<4 eV. Analysis of the evolution of the spectra under thermal and phototreatment in ultrahigh vacuum and in oxygen reveals that oxygen atoms from Cu-O planes possess the highest mobility in the lattice and the surface of the single crystal is formed by Bi-O planes.
UR - http://www.scopus.com/inward/record.url?scp=0032390273&partnerID=8YFLogxK
U2 - 10.1134/1.1262015
DO - 10.1134/1.1262015
M3 - Article
AN - SCOPUS:0032390273
VL - 24
SP - 112
EP - 114
JO - Technical Physics Letters
JF - Technical Physics Letters
SN - 1063-7850
IS - 2
ER -
ID: 43496059