Electron microscopy methods in studies of cultural heritage sites

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Electron microscopy methods in studies of cultural heritage sites. / Vasiliev, A. L.; Kovalchuk, M. V.; Yatsishina, E. B.

In: Crystallography Reports, Vol. 61, No. 6, 01.11.2016, p. 873-885.

Research output: Contribution to journal › Review article › peer-review

Author

Vasiliev, A. L. ; Kovalchuk, M. V. ; Yatsishina, E. B. / Electron microscopy methods in studies of cultural heritage sites. In: Crystallography Reports. 2016 ; Vol. 61, No. 6. pp. 873-885.

BibTeX

@article{42db366420e54a478a1332c63cc26dc1,

title = "Electron microscopy methods in studies of cultural heritage sites",

abstract = "The history of the development and application of scanning electron microscopy (SEM), transmission electron microscopy (TEM), and energy-dispersive X-ray microanalysis (EDXMA) in studies of cultural heritage sites is considered. In fact, investigations based on these methods began when electron microscopes became a commercial product. Currently, these methods, being developed and improved, help solve many historical enigmas. To date, electron microscopy combined with microanalysis makes it possible to investigate any object, from parchment and wooden articles to pigments, tools, and objects of art. Studies by these methods have revealed that some articles were made by ancient masters using ancient “nanotechnologies”; hence, their comprehensive analysis calls for the latest achievements in the corresponding instrumental methods and sample preparation techniques.",

author = "Vasiliev, {A. L.} and Kovalchuk, {M. V.} and Yatsishina, {E. B.}",

note = "Publisher Copyright: {\textcopyright} 2016, Pleiades Publishing, Inc.",

year = "2016",

month = nov,

day = "1",

doi = "10.1134/S1063774516060183",

language = "English",

volume = "61",

pages = "873--885",

journal = "Crystallography Reports",

issn = "1063-7745",

publisher = "МАИК {"}Наука/Интерпериодика{"}",

number = "6",

}

RIS

TY - JOUR

T1 - Electron microscopy methods in studies of cultural heritage sites

AU - Vasiliev, A. L.

AU - Kovalchuk, M. V.

AU - Yatsishina, E. B.

PY - 2016/11/1

Y1 - 2016/11/1

N2 - The history of the development and application of scanning electron microscopy (SEM), transmission electron microscopy (TEM), and energy-dispersive X-ray microanalysis (EDXMA) in studies of cultural heritage sites is considered. In fact, investigations based on these methods began when electron microscopes became a commercial product. Currently, these methods, being developed and improved, help solve many historical enigmas. To date, electron microscopy combined with microanalysis makes it possible to investigate any object, from parchment and wooden articles to pigments, tools, and objects of art. Studies by these methods have revealed that some articles were made by ancient masters using ancient “nanotechnologies”; hence, their comprehensive analysis calls for the latest achievements in the corresponding instrumental methods and sample preparation techniques.

AB - The history of the development and application of scanning electron microscopy (SEM), transmission electron microscopy (TEM), and energy-dispersive X-ray microanalysis (EDXMA) in studies of cultural heritage sites is considered. In fact, investigations based on these methods began when electron microscopes became a commercial product. Currently, these methods, being developed and improved, help solve many historical enigmas. To date, electron microscopy combined with microanalysis makes it possible to investigate any object, from parchment and wooden articles to pigments, tools, and objects of art. Studies by these methods have revealed that some articles were made by ancient masters using ancient “nanotechnologies”; hence, their comprehensive analysis calls for the latest achievements in the corresponding instrumental methods and sample preparation techniques.

UR - http://www.scopus.com/inward/record.url?scp=84995442510&partnerID=8YFLogxK

U2 - 10.1134/S1063774516060183

DO - 10.1134/S1063774516060183

M3 - Review article

AN - SCOPUS:84995442510

VL - 61

SP - 873

EP - 885

JO - Crystallography Reports

JF - Crystallography Reports

SN - 1063-7745

IS - 6

ER -

ID: 88202845