The goal of this study is to construct simple electromechanical models of nanoresonators as mass detectors. A major obstacle in the achievement of sufficient measurement accuracy for the resonant frequency associated with the adsorption of additional mass onto the graphene layer is a low quality factor of the oscillatory system containing the graphene layer. A graphene resonator can be considered as an elastic system with distributed parameters. The application of the Galerkin method to study nearly resonant vibrational modes reduces the problem to considering an oscillatory system with a few degrees of freedom with pronounced nonlinear properties. These properties are, first of all, due to the nonlinear dependence of the forces produced by the electric field on the graphene deflection and, second, due to the nonlinear dependence of the graphene layer tension on its deflection. Taking into account the nonlinear properties leads to the appearance of characteristic drops in the resonance curve which allow for a more accurate resonant frequency measurement. Resonance curves with such characteristic drops can be obtained using a demonstration experimental macromodel of the resonator. Two absolutely new layouts are proposed, such as a differential resonator and resonator with parametric excitation. The oscillations excited in the differential resonator that contains two graphene layers resemble beats. In this case, small changes in the mass of the main layer correspond to significant changes in the frequency of the envelope. This effect is illustrated by oscillograms obtained for an experimental macromodel of the differential resonator. The parametric resonator has one graphene layer between two conducting surfaces. Parametric excitation of steady-state high amplitude oscillations is possible in this resonator only in a narrow frequency band close to the eigenfrequency. The band width reduces with a decrease in the quality factor of the oscillatory system. The latter fact can be useful for the improvement of eigenfrequency measurement accuracy at a low quality factor of the oscillatory system.