Research output: Contribution to journal › Article › peer-review
The effect of the spatial structure of an interface in multilayer metallic films on the spectrum of x-ray specular scattering is studied. Two types of interface structural defects are considered. One type is steps resulting in a variable layer thickness, and the other is the mixing of unlike metal atoms during epitaxial growth. These defects are shown to have different effects on the specular-scattering spectra. The mixing significantly decreases the Bragg-peak height, especially the height of higher order peaks. The interface roughness results in broadening of the Bragg peaks and in the disappearance of intermediate peaks between them.
Original language | English |
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Pages (from-to) | 155-163 |
Number of pages | 9 |
Journal | Physics of the Solid State |
Volume | 48 |
Issue number | 1 |
DOIs | |
State | Published - 1 Jan 2006 |
ID: 40339299