Research output: Contribution to journal › Article › peer-review
Effect of exchange interaction on the spin fluctuations of localized electrons. / Smirnov, D. S.; Glazov, M. M.; Ivchenko, E. L.
In: Physics of the Solid State, Vol. 56, No. 2, 01.02.2014, p. 254-262.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Effect of exchange interaction on the spin fluctuations of localized electrons
AU - Smirnov, D. S.
AU - Glazov, M. M.
AU - Ivchenko, E. L.
PY - 2014/2/1
Y1 - 2014/2/1
N2 - A microscopic theory of spin fluctuations in an ensemble of electrons localized on donors in a bulk semiconductor has been developed. Both the hyperfine interaction of the electron spin with spins of host lattice nuclei and the exchange interaction between the electrons have been taken into account. A model of clusters to calculate spin noise spectra of the ensemble of localized charge carriers has been proposed. It has been shown that the electron-electron exchange interaction leads to an effective averaging of random nuclear fields and a shift of the peak in the spin-fluctuation spectrum towards lower frequencies.
AB - A microscopic theory of spin fluctuations in an ensemble of electrons localized on donors in a bulk semiconductor has been developed. Both the hyperfine interaction of the electron spin with spins of host lattice nuclei and the exchange interaction between the electrons have been taken into account. A model of clusters to calculate spin noise spectra of the ensemble of localized charge carriers has been proposed. It has been shown that the electron-electron exchange interaction leads to an effective averaging of random nuclear fields and a shift of the peak in the spin-fluctuation spectrum towards lower frequencies.
UR - http://www.scopus.com/inward/record.url?scp=84893984184&partnerID=8YFLogxK
U2 - 10.1134/S1063783414020280
DO - 10.1134/S1063783414020280
M3 - Article
AN - SCOPUS:84893984184
VL - 56
SP - 254
EP - 262
JO - Physics of the Solid State
JF - Physics of the Solid State
SN - 1063-7834
IS - 2
ER -
ID: 36365760