Standard

Effect of Electronic Excitation on High-Temperature Flows of Ionized Nitrogen and Oxygen Mixtures behind Strong Shock Waves. / Istomin, V.A.; Kustova, E.V.

In: AIP Conference Proceedings, Vol. 1786, 2016, p. 150003.

Research output: Contribution to journal › Article › peer-review

Harvard

Istomin, VA & Kustova, EV 2016, 'Effect of Electronic Excitation on High-Temperature Flows of Ionized Nitrogen and Oxygen Mixtures behind Strong Shock Waves', AIP Conference Proceedings, vol. 1786, pp. 150003. https://doi.org/10.1063/1.4967644

APA

Istomin, V. A., & Kustova, E. V. (2016). Effect of Electronic Excitation on High-Temperature Flows of Ionized Nitrogen and Oxygen Mixtures behind Strong Shock Waves. AIP Conference Proceedings, 1786, 150003. https://doi.org/10.1063/1.4967644

Vancouver

Istomin VA, Kustova EV. Effect of Electronic Excitation on High-Temperature Flows of Ionized Nitrogen and Oxygen Mixtures behind Strong Shock Waves. AIP Conference Proceedings. 2016;1786:150003. https://doi.org/10.1063/1.4967644

Author

Istomin, V.A. ; Kustova, E.V. / Effect of Electronic Excitation on High-Temperature Flows of Ionized Nitrogen and Oxygen Mixtures behind Strong Shock Waves. In: AIP Conference Proceedings. 2016 ; Vol. 1786. pp. 150003.

BibTeX

@article{df8bd21996cd430caa2d46dbab82c695,
title = "Effect of Electronic Excitation on High-Temperature Flows of Ionized Nitrogen and Oxygen Mixtures behind Strong Shock Waves",
author = "V.A. Istomin and E.V. Kustova",
year = "2016",
doi = "http://dx.doi.org/10.1063/1.4967644",
language = "English",
volume = "1786",
pages = "150003",
journal = "AIP Conference Proceedings",
issn = "0094-243X",
publisher = "American Institute of Physics",

}

RIS

TY - JOUR

T1 - Effect of Electronic Excitation on High-Temperature Flows of Ionized Nitrogen and Oxygen Mixtures behind Strong Shock Waves

AU - Istomin, V.A.

AU - Kustova, E.V.

PY - 2016

Y1 - 2016

U2 - http://dx.doi.org/10.1063/1.4967644

DO - http://dx.doi.org/10.1063/1.4967644

M3 - Article

VL - 1786

SP - 150003

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

SN - 0094-243X

ER -

ID: 7596644