Research output: Contribution to journal › Article › peer-review
Dynamic All-Optical Control in Ultrashort Double-pulse Laser Ablation. / Kudryashov, Sergey I.; Samokhvalov, Andrey A.; Golubev, Yaroslav D.; Ivanov, Dmitry S.; Garcia, Martin E.; Veiko, Vadim P.; Rethfeld, Baerbel; Yu. Mikhailovskii, Vladimir.
In: Applied Surface Science, Vol. 537, 147940, 30.01.2021.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Dynamic All-Optical Control in Ultrashort Double-pulse Laser Ablation
AU - Kudryashov, Sergey I.
AU - Samokhvalov, Andrey A.
AU - Golubev, Yaroslav D.
AU - Ivanov, Dmitry S.
AU - Garcia, Martin E.
AU - Veiko, Vadim P.
AU - Rethfeld, Baerbel
AU - Yu. Mikhailovskii, Vladimir
N1 - Publisher Copyright: © 2020 Elsevier B.V.
PY - 2021/1/30
Y1 - 2021/1/30
N2 - Double-pulse femtosecond laser ablation of thin aluminum films and bulk aluminum counterintuitively demonstrated a strong (60-70%) raise of the thickness-dependent thresholds for inter-pulse delays of 20-200 ps, preventing material removal at above-threshold fluencies. Time-resolved optical pump-probe reflection and double-pump transmission studies were performed and confirmed the variation of the ablation threhold depending on the interpulse delay. To support the experimental measurements, the process of double-pulse laser ablation was modelled with the combined atomistic-continuum model. The applied model can describe the laser-induced non-equilibrium phase transition processes at atomic precision, whereas the effect of free carriers, playing a determinant role for the case of ultrashort laser pulses, is accounted for in the continuum. The simulations revealed the underlying pre-ablative laser-induced stress dynamics in the hot, acoustically relaxed Al melt, crucially sensitive to the second pump-pulse compressive pressurization. The results of theoretical and experimental study enable efficient dynamic all-optical control of ultrafast laser ablation.
AB - Double-pulse femtosecond laser ablation of thin aluminum films and bulk aluminum counterintuitively demonstrated a strong (60-70%) raise of the thickness-dependent thresholds for inter-pulse delays of 20-200 ps, preventing material removal at above-threshold fluencies. Time-resolved optical pump-probe reflection and double-pump transmission studies were performed and confirmed the variation of the ablation threhold depending on the interpulse delay. To support the experimental measurements, the process of double-pulse laser ablation was modelled with the combined atomistic-continuum model. The applied model can describe the laser-induced non-equilibrium phase transition processes at atomic precision, whereas the effect of free carriers, playing a determinant role for the case of ultrashort laser pulses, is accounted for in the continuum. The simulations revealed the underlying pre-ablative laser-induced stress dynamics in the hot, acoustically relaxed Al melt, crucially sensitive to the second pump-pulse compressive pressurization. The results of theoretical and experimental study enable efficient dynamic all-optical control of ultrafast laser ablation.
KW - thin films
KW - double-pulse laser ablation
KW - spallation
KW - pump-probe
KW - acoustic relaxation
KW - two-temperature model
KW - molecular dynamics simulations
KW - all-optical control
KW - thin films
KW - double-pulse laser ablation
KW - spallation
KW - pump-probe
KW - acoustic relaxation
KW - two-temperature model
KW - molecular dynamics simulations
KW - all-optical control
KW - All-optical control
KW - Molecular dynamics simulations
KW - Two-temperature model
KW - Thin films
KW - Double-pulse laser ablation
KW - Pump-probe
KW - Acoustic relaxation
KW - Spallation
KW - MOLECULAR-DYNAMICS
KW - METAL TARGETS
KW - SILICON
KW - ALUMINUM
KW - SPALLATION
KW - LIQUIDS
UR - http://www.scopus.com/inward/record.url?scp=85092067872&partnerID=8YFLogxK
UR - https://www.mendeley.com/catalogue/07a49d0f-f1d3-3764-a679-bb6cba19d853/
U2 - 10.1016/j.apsusc.2020.147940
DO - 10.1016/j.apsusc.2020.147940
M3 - Article
VL - 537
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
M1 - 147940
ER -
ID: 62767280