Research output: Contribution to journal › Conference article › peer-review
Dislocations in silicon as a tool to be used in optics, electronics and biology. / Kittler, M.; Reiche, M.; Arguirov, T.; Mchedlidze, T.; Seifert, W.; Vyvenko, O. F.; Wilhelm, T.; Yu, X.
In: Solid State Phenomena, Vol. 131-133, 2008, p. 289-292.Research output: Contribution to journal › Conference article › peer-review
}
TY - JOUR
T1 - Dislocations in silicon as a tool to be used in optics, electronics and biology
AU - Kittler, M.
AU - Reiche, M.
AU - Arguirov, T.
AU - Mchedlidze, T.
AU - Seifert, W.
AU - Vyvenko, O. F.
AU - Wilhelm, T.
AU - Yu, X.
PY - 2008
Y1 - 2008
KW - Biomolecules
KW - Conductance
KW - D-bands
KW - Dislocations
KW - Si
KW - Stark effect
UR - http://www.scopus.com/inward/record.url?scp=38549175640&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:38549175640
VL - 131-133
SP - 289
EP - 292
JO - Solid State Phenomena
JF - Solid State Phenomena
SN - 1012-0394
T2 - 12th International Autumn Meeting: Gettering and Defect Engineering in Semiconductor Technology, GADEST 2007
Y2 - 14 October 2007 through 19 October 2007
ER -
ID: 87672503