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Diffraction pattern degradation driven by intense ultrafast X-ray pulse for H2+. / Borovykh, S.V.; Smirnov, V.V.; Митюрева, Алла Александровна.

In: Physics Letters A, Vol. 389, 127088, 15.02.2021.

Research output: Contribution to journal › Article › peer-review

Harvard

Borovykh, SV, Smirnov, VV & Митюрева, АА 2021, 'Diffraction pattern degradation driven by intense ultrafast X-ray pulse for H2+', Physics Letters A, vol. 389, 127088. https://doi.org/10.1016/j.physleta.2020.127088

APA

Borovykh, S. V., Smirnov, V. V., & Митюрева, А. А. (2021). Diffraction pattern degradation driven by intense ultrafast X-ray pulse for H2+. Physics Letters A, 389, [127088]. https://doi.org/10.1016/j.physleta.2020.127088

Vancouver

Borovykh SV, Smirnov VV, Митюрева АА. Diffraction pattern degradation driven by intense ultrafast X-ray pulse for H2+. Physics Letters A. 2021 Feb 15;389. 127088. https://doi.org/10.1016/j.physleta.2020.127088

Author

Borovykh, S.V. ; Smirnov, V.V. ; Митюрева, Алла Александровна. / Diffraction pattern degradation driven by intense ultrafast X-ray pulse for H2+. In: Physics Letters A. 2021 ; Vol. 389.

BibTeX

@article{dfc3b3ee8e5d4a7888a9799f4c038aad,
title = "Diffraction pattern degradation driven by intense ultrafast X-ray pulse for H2+",
abstract = "The drastic evolution of molecular systems exposed to ultrashort intense X-ray pulse is a fundamental obstacle for single-particle imaging (SPI) by means of X-ray free electron lasers (XFEL). Here we tackle the simplest molecule H2+ and its diffraction pattern degradations in the strong ultrashort X-ray beam. The semiclassical method of the problem solution and its advantages are described in detail. We apply the method to calculate the electron density autocorrelation functions (ACF) for a few internuclear distances and then discuss numeric simulation data.",
keywords = "X-ray free electron lasers, XFEL, Molecular degradation, Ionization, Hydrogen ion, Single-particle imaging, Hydrogen ion, Ionization, Molecular degradation, Single-particle imaging, X-ray free electron lasers, XFEL",
author = "S.V. Borovykh and V.V. Smirnov and Митюрева, {Алла Александровна}",
year = "2021",
month = feb,
day = "15",
doi = "10.1016/j.physleta.2020.127088",
language = "English",
volume = "389",
journal = "Physics Letters A",
issn = "0375-9601",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Diffraction pattern degradation driven by intense ultrafast X-ray pulse for H2+

AU - Borovykh, S.V.

AU - Smirnov, V.V.

AU - Митюрева, Алла Александровна

PY - 2021/2/15

Y1 - 2021/2/15

N2 - The drastic evolution of molecular systems exposed to ultrashort intense X-ray pulse is a fundamental obstacle for single-particle imaging (SPI) by means of X-ray free electron lasers (XFEL). Here we tackle the simplest molecule H2+ and its diffraction pattern degradations in the strong ultrashort X-ray beam. The semiclassical method of the problem solution and its advantages are described in detail. We apply the method to calculate the electron density autocorrelation functions (ACF) for a few internuclear distances and then discuss numeric simulation data.

AB - The drastic evolution of molecular systems exposed to ultrashort intense X-ray pulse is a fundamental obstacle for single-particle imaging (SPI) by means of X-ray free electron lasers (XFEL). Here we tackle the simplest molecule H2+ and its diffraction pattern degradations in the strong ultrashort X-ray beam. The semiclassical method of the problem solution and its advantages are described in detail. We apply the method to calculate the electron density autocorrelation functions (ACF) for a few internuclear distances and then discuss numeric simulation data.

KW - X-ray free electron lasers

KW - XFEL

KW - Molecular degradation

KW - Ionization

KW - Hydrogen ion

KW - Single-particle imaging

KW - Hydrogen ion

KW - Ionization

KW - Molecular degradation

KW - Single-particle imaging

KW - X-ray free electron lasers

KW - XFEL

UR - http://www.scopus.com/inward/record.url?scp=85097883307&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/f3093649-8844-3d2d-82a6-c7660d8fd942/

U2 - 10.1016/j.physleta.2020.127088

DO - 10.1016/j.physleta.2020.127088

M3 - Article

VL - 389

JO - Physics Letters A

JF - Physics Letters A

SN - 0375-9601

M1 - 127088

ER -

ID: 71727311