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Determination of the Nonlinear Contribution to Refraction of Compressed Xenon at λ = 308 nm by the Self-Diffraction Method. / Bertsev, V. V.; Bureiko, S. F.; Karklit, A. Yu; Pastor, A. A.; Serdobintsev, P. Yu.

In: Optics and Spectroscopy (English translation of Optika i Spektroskopiya), Vol. 86, No. 6, 01.06.1999, p. 830-832.

Research output: Contribution to journal › Article › peer-review

Harvard

Bertsev, VV, Bureiko, SF, Karklit, AY, Pastor, AA & Serdobintsev, PY 1999, 'Determination of the Nonlinear Contribution to Refraction of Compressed Xenon at λ = 308 nm by the Self-Diffraction Method', Optics and Spectroscopy (English translation of Optika i Spektroskopiya), vol. 86, no. 6, pp. 830-832.

APA

Bertsev, V. V., Bureiko, S. F., Karklit, A. Y., Pastor, A. A., & Serdobintsev, P. Y. (1999). Determination of the Nonlinear Contribution to Refraction of Compressed Xenon at λ = 308 nm by the Self-Diffraction Method. Optics and Spectroscopy (English translation of Optika i Spektroskopiya), 86(6), 830-832.

Vancouver

Bertsev VV, Bureiko SF, Karklit AY, Pastor AA, Serdobintsev PY. Determination of the Nonlinear Contribution to Refraction of Compressed Xenon at λ = 308 nm by the Self-Diffraction Method. Optics and Spectroscopy (English translation of Optika i Spektroskopiya). 1999 Jun 1;86(6):830-832.

Author

Bertsev, V. V. ; Bureiko, S. F. ; Karklit, A. Yu ; Pastor, A. A. ; Serdobintsev, P. Yu. / Determination of the Nonlinear Contribution to Refraction of Compressed Xenon at λ = 308 nm by the Self-Diffraction Method. In: Optics and Spectroscopy (English translation of Optika i Spektroskopiya). 1999 ; Vol. 86, No. 6. pp. 830-832.

BibTeX

@article{39b1788518f14f809dfa0f0a83456424,
title = "Determination of the Nonlinear Contribution to Refraction of Compressed Xenon at λ = 308 nm by the Self-Diffraction Method",
abstract = "Parameters of a diffraction pattern obtained through diffraction of a probe beam of laser radiation by a phase inhomogeneity formed by radiation of a XeCl laser focused into a cell with compressed xenon were measured. The nonlinear addition to the refractive index was found to have the value n2 = 4.7 × 10-12 cm2/W. Plausible mechanisms of nonlinearity are discussed.",
author = "Bertsev, {V. V.} and Bureiko, {S. F.} and Karklit, {A. Yu} and Pastor, {A. A.} and Serdobintsev, {P. Yu}",
year = "1999",
month = jun,
day = "1",
language = "English",
volume = "86",
pages = "830--832",
journal = "OPTICS AND SPECTROSCOPY",
issn = "0030-400X",
publisher = "Pleiades Publishing",
number = "6",

}

RIS

TY - JOUR

T1 - Determination of the Nonlinear Contribution to Refraction of Compressed Xenon at λ = 308 nm by the Self-Diffraction Method

AU - Bertsev, V. V.

AU - Bureiko, S. F.

AU - Karklit, A. Yu

AU - Pastor, A. A.

AU - Serdobintsev, P. Yu

PY - 1999/6/1

Y1 - 1999/6/1

N2 - Parameters of a diffraction pattern obtained through diffraction of a probe beam of laser radiation by a phase inhomogeneity formed by radiation of a XeCl laser focused into a cell with compressed xenon were measured. The nonlinear addition to the refractive index was found to have the value n2 = 4.7 × 10-12 cm2/W. Plausible mechanisms of nonlinearity are discussed.

AB - Parameters of a diffraction pattern obtained through diffraction of a probe beam of laser radiation by a phase inhomogeneity formed by radiation of a XeCl laser focused into a cell with compressed xenon were measured. The nonlinear addition to the refractive index was found to have the value n2 = 4.7 × 10-12 cm2/W. Plausible mechanisms of nonlinearity are discussed.

UR - http://www.scopus.com/inward/record.url?scp=0347032699&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0347032699

VL - 86

SP - 830

EP - 832

JO - OPTICS AND SPECTROSCOPY

JF - OPTICS AND SPECTROSCOPY

SN - 0030-400X

IS - 6

ER -

ID: 47840134