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Detection of the border dead layer in thick quantum wells GaAs/AlGaAs. / Ubyivovk, E. V.; Loginov, D. K.; Gerlovin, I. Ya.; Dolgikh, Yu. K.; Efimov, Yu. P.; Eliseev, S. A.; Petrov, V. V.; Vyvenko, O. F.; Sitnikova, A. A.; Kirilenko, D. A.
XXII Russian Conference of the electron microscopy. 2008.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research
Harvard
Ubyivovk, EV, Loginov, DK, Gerlovin, IY, Dolgikh, YK, Efimov, YP, Eliseev, SA, Petrov, VV
, Vyvenko, OF, Sitnikova, AA & Kirilenko, DA 2008,
Detection of the border dead layer in thick quantum wells GaAs/AlGaAs. in
XXII Russian Conference of the electron microscopy.
APA
Ubyivovk, E. V., Loginov, D. K., Gerlovin, I. Y., Dolgikh, Y. K., Efimov, Y. P., Eliseev, S. A., Petrov, V. V.
, Vyvenko, O. F., Sitnikova, A. A., & Kirilenko, D. A. (2008).
Detection of the border dead layer in thick quantum wells GaAs/AlGaAs. In
XXII Russian Conference of the electron microscopy
Vancouver
Author
Ubyivovk, E. V. ; Loginov, D. K. ; Gerlovin, I. Ya. ; Dolgikh, Yu. K. ; Efimov, Yu. P. ; Eliseev, S. A. ; Petrov, V. V.
; Vyvenko, O. F. ; Sitnikova, A. A. ; Kirilenko, D. A. /
Detection of the border dead layer in thick quantum wells GaAs/AlGaAs. XXII Russian Conference of the electron microscopy. 2008.
BibTeX
@inproceedings{f4686874780546da8beec84fd653bfe4,
title = "Detection of the border dead layer in thick quantum wells GaAs/AlGaAs",
author = "Ubyivovk, {E. V.} and Loginov, {D. K.} and Gerlovin, {I. Ya.} and Dolgikh, {Yu. K.} and Efimov, {Yu. P.} and Eliseev, {S. A.} and Petrov, {V. V.} and Vyvenko, {O. F.} and Sitnikova, {A. A.} and Kirilenko, {D. A.}",
year = "2008",
language = "English",
booktitle = "XXII Russian Conference of the electron microscopy",
}
RIS
TY - GEN
T1 - Detection of the border dead layer in thick quantum wells GaAs/AlGaAs
AU - Ubyivovk, E. V.
AU - Loginov, D. K.
AU - Gerlovin, I. Ya.
AU - Dolgikh, Yu. K.
AU - Efimov, Yu. P.
AU - Eliseev, S. A.
AU - Petrov, V. V.
AU - Vyvenko, O. F.
AU - Sitnikova, A. A.
AU - Kirilenko, D. A.
PY - 2008
Y1 - 2008
M3 - Conference contribution
BT - XXII Russian Conference of the electron microscopy
ER -
