Standard

Copper, cadmium and thallium thin film sensors based on chalcogenide glasses. / Mourzina, Yu G.; Schöning, M. J.; Schubert, J.; Zander, W.; Legin, A. V.; Vlasov, Yu G.; Lüth, H.

In: Analytica Chimica Acta, Vol. 433, No. 1, 04.04.2001, p. 103-110.

Research output: Contribution to journal › Article › peer-review

Harvard

Mourzina, YG, Schöning, MJ, Schubert, J, Zander, W, Legin, AV, Vlasov, YG & Lüth, H 2001, 'Copper, cadmium and thallium thin film sensors based on chalcogenide glasses', Analytica Chimica Acta, vol. 433, no. 1, pp. 103-110. https://doi.org/10.1016/S0003-2670(00)01384-2

APA

Mourzina, Y. G., Schöning, M. J., Schubert, J., Zander, W., Legin, A. V., Vlasov, Y. G., & Lüth, H. (2001). Copper, cadmium and thallium thin film sensors based on chalcogenide glasses. Analytica Chimica Acta, 433(1), 103-110. https://doi.org/10.1016/S0003-2670(00)01384-2

Vancouver

Mourzina YG, Schöning MJ, Schubert J, Zander W, Legin AV, Vlasov YG et al. Copper, cadmium and thallium thin film sensors based on chalcogenide glasses. Analytica Chimica Acta. 2001 Apr 4;433(1):103-110. https://doi.org/10.1016/S0003-2670(00)01384-2

Author

Mourzina, Yu G. ; Schöning, M. J. ; Schubert, J. ; Zander, W. ; Legin, A. V. ; Vlasov, Yu G. ; Lüth, H. / Copper, cadmium and thallium thin film sensors based on chalcogenide glasses. In: Analytica Chimica Acta. 2001 ; Vol. 433, No. 1. pp. 103-110.

BibTeX

@article{c13b259a4e6a4b408ca5456c0a8a17a4,
title = "Copper, cadmium and thallium thin film sensors based on chalcogenide glasses",
abstract = "All-solid-state copper, cadmium and thallium sensors based on chalcogenide thin film layers prepared by means of the pulsed laser deposition (PLD) technique have been developed. The sensitive layers have been investigated using Rutherford backscattering spectrometry (RBS) and transmission electron microscopy (TEM). The electrochemical behaviour of the sensors in terms of ionic sensitivity, limit of detection, Nernstian response interval, the effect of the pH, selectivity coefficients, dynamic response time and drift has been evaluated. The results of copper, cadmium and nickel analysis in industrial solutions using the developed sensors are presented.",
keywords = "All-solid-state, Chalcogenide glasses, Chemical sensor, Heavy metal determination, Pulsed laser deposition, Thin film",
author = "Mourzina, {Yu G.} and Sch{\"o}ning, {M. J.} and J. Schubert and W. Zander and Legin, {A. V.} and Vlasov, {Yu G.} and H. L{\"u}th",
year = "2001",
month = apr,
day = "4",
doi = "10.1016/S0003-2670(00)01384-2",
language = "English",
volume = "433",
pages = "103--110",
journal = "Analytica Chimica Acta",
issn = "0003-2670",
publisher = "Elsevier",
number = "1",

}

RIS

TY - JOUR

T1 - Copper, cadmium and thallium thin film sensors based on chalcogenide glasses

AU - Mourzina, Yu G.

AU - Schöning, M. J.

AU - Schubert, J.

AU - Zander, W.

AU - Legin, A. V.

AU - Vlasov, Yu G.

AU - Lüth, H.

PY - 2001/4/4

Y1 - 2001/4/4

N2 - All-solid-state copper, cadmium and thallium sensors based on chalcogenide thin film layers prepared by means of the pulsed laser deposition (PLD) technique have been developed. The sensitive layers have been investigated using Rutherford backscattering spectrometry (RBS) and transmission electron microscopy (TEM). The electrochemical behaviour of the sensors in terms of ionic sensitivity, limit of detection, Nernstian response interval, the effect of the pH, selectivity coefficients, dynamic response time and drift has been evaluated. The results of copper, cadmium and nickel analysis in industrial solutions using the developed sensors are presented.

AB - All-solid-state copper, cadmium and thallium sensors based on chalcogenide thin film layers prepared by means of the pulsed laser deposition (PLD) technique have been developed. The sensitive layers have been investigated using Rutherford backscattering spectrometry (RBS) and transmission electron microscopy (TEM). The electrochemical behaviour of the sensors in terms of ionic sensitivity, limit of detection, Nernstian response interval, the effect of the pH, selectivity coefficients, dynamic response time and drift has been evaluated. The results of copper, cadmium and nickel analysis in industrial solutions using the developed sensors are presented.

KW - All-solid-state

KW - Chalcogenide glasses

KW - Chemical sensor

KW - Heavy metal determination

KW - Pulsed laser deposition

KW - Thin film

UR - http://www.scopus.com/inward/record.url?scp=0035804821&partnerID=8YFLogxK

U2 - 10.1016/S0003-2670(00)01384-2

DO - 10.1016/S0003-2670(00)01384-2

M3 - Article

AN - SCOPUS:0035804821

VL - 433

SP - 103

EP - 110

JO - Analytica Chimica Acta

JF - Analytica Chimica Acta

SN - 0003-2670

IS - 1

ER -

ID: 30516021