Research output: Contribution to journal › Article › peer-review
Computer simulation of kinetic processes near a semiconductor surface at a high electric field using the particle method. / Gherm, V. E.; Mileshkina, N. V.; Semykina, E. A.
In: Journal of Physics: Condensed Matter, Vol. 4, No. 6, 019, 1992, p. 1545-1554.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Computer simulation of kinetic processes near a semiconductor surface at a high electric field using the particle method
AU - Gherm, V. E.
AU - Mileshkina, N. V.
AU - Semykina, E. A.
PY - 1992
Y1 - 1992
N2 - The feasibility of computer simulation of electronic relaxation at a semiconductor-vacuum interface under a strong electric field is demonstrated. A kinetic description of conduction band electrons in a space-charge region layer with a self-consistent electric field under electron-impurity and electron-phonon scattering is developed by the particle method and Monte Carlo procedure. Results for the transient electronic process in a semiconductor field emitter are given.
AB - The feasibility of computer simulation of electronic relaxation at a semiconductor-vacuum interface under a strong electric field is demonstrated. A kinetic description of conduction band electrons in a space-charge region layer with a self-consistent electric field under electron-impurity and electron-phonon scattering is developed by the particle method and Monte Carlo procedure. Results for the transient electronic process in a semiconductor field emitter are given.
UR - http://www.scopus.com/inward/record.url?scp=0041691501&partnerID=8YFLogxK
U2 - 10.1088/0953-8984/4/6/019
DO - 10.1088/0953-8984/4/6/019
M3 - Article
AN - SCOPUS:0041691501
VL - 4
SP - 1545
EP - 1554
JO - Journal of Physics Condensed Matter
JF - Journal of Physics Condensed Matter
SN - 0953-8984
IS - 6
M1 - 019
ER -
ID: 18140787