Research output: Contribution to journal › Article › peer-review
Complex objects quality estimation under uncertainty. / Hovanov, N. V.; Kolganov, S. K.; Kornikov, V. V.; Popov, P. G.
In: Microelectronics Reliability, Vol. 38, No. 3, 01.12.1998, p. 421-426.Research output: Contribution to journal › Article › peer-review
}
TY - JOUR
T1 - Complex objects quality estimation under uncertainty
AU - Hovanov, N. V.
AU - Kolganov, S. K.
AU - Kornikov, V. V.
AU - Popov, P. G.
PY - 1998/12/1
Y1 - 1998/12/1
N2 - The actual problem of complex systems quality multicriteria estimation and uncertainty may be radically simplified by using a new mathematical methodology named ASPID (Analysis and Synthesis of Parameters under Information Deficiency). General indices of Complex Systems Construction under Information Deficiency, 1994. The main purpose of this paper consists in the presenting of basic concepts of ASPID methodology.
AB - The actual problem of complex systems quality multicriteria estimation and uncertainty may be radically simplified by using a new mathematical methodology named ASPID (Analysis and Synthesis of Parameters under Information Deficiency). General indices of Complex Systems Construction under Information Deficiency, 1994. The main purpose of this paper consists in the presenting of basic concepts of ASPID methodology.
UR - http://www.scopus.com/inward/record.url?scp=0032020985&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0032020985
VL - 38
SP - 421
EP - 426
JO - Microelectronics Reliability
JF - Microelectronics Reliability
SN - 0026-2714
IS - 3
ER -
ID: 36692734