Research output: Contribution to journal › Article › peer-review
Characteristics of a Silicon Carbide Field Emission Array under Pre-Breakdown Conditions. / Морозов, Виктор Александрович; Егоров, Николай Васильевич; Трофимов, Василий Валерьевич; Никифоров, Константин Аркадьевич; Закиров, Ильдар Илюсович; Кац, Виктор Михайлович; Ильин, Владимир; Иванов, Алексей.
In: Technical Physics, Vol. 69, No. 7, 27.09.2024, p. 2059-2065.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Characteristics of a Silicon Carbide Field Emission Array under Pre-Breakdown Conditions
AU - Морозов, Виктор Александрович
AU - Егоров, Николай Васильевич
AU - Трофимов, Василий Валерьевич
AU - Никифоров, Константин Аркадьевич
AU - Закиров, Ильдар Илюсович
AU - Кац, Виктор Михайлович
AU - Ильин, Владимир
AU - Иванов, Алексей
PY - 2024/9/27
Y1 - 2024/9/27
N2 - Abstract: This study assesses promising field electron sources based on silicon carbide monolithic field emission array (FEA). FEA is fabricated on single-crystal wafers of silicon carbide (0001C) 6H-SiC of n-type conductivity using the technology of two-stage reactive ion etching in SF6/O2/Ar atmosphere. To implement conditions close to breakdown, an experimental setup based on high-voltage narrow pulses generating device GKVI-300 was used. A series of nanosecond voltage pulses with amplitudes from 120 to 250 kV was generated. To study the characteristics of the FEA in the pre-breakdown state, the beam of field emitted electrons was separated from the ion torch or cathode plasma, formed in the following breakdown phases, by placing a 50-μm-thick titanium foil under zero potential into the interelectrode gap. Current-voltage characteristics of peak-currents vs. peak-voltages passing through the foil are close to rectilinear in the Fowler–Nordheim coordinates. The current-voltage characteristics plotted for each of the pulses along increasing and decreasing branches show a discrepancy (hysteresis). After the experiments, the silicon carbide cathode FEA was studied in a scanning electron microscope.
AB - Abstract: This study assesses promising field electron sources based on silicon carbide monolithic field emission array (FEA). FEA is fabricated on single-crystal wafers of silicon carbide (0001C) 6H-SiC of n-type conductivity using the technology of two-stage reactive ion etching in SF6/O2/Ar atmosphere. To implement conditions close to breakdown, an experimental setup based on high-voltage narrow pulses generating device GKVI-300 was used. A series of nanosecond voltage pulses with amplitudes from 120 to 250 kV was generated. To study the characteristics of the FEA in the pre-breakdown state, the beam of field emitted electrons was separated from the ion torch or cathode plasma, formed in the following breakdown phases, by placing a 50-μm-thick titanium foil under zero potential into the interelectrode gap. Current-voltage characteristics of peak-currents vs. peak-voltages passing through the foil are close to rectilinear in the Fowler–Nordheim coordinates. The current-voltage characteristics plotted for each of the pulses along increasing and decreasing branches show a discrepancy (hysteresis). After the experiments, the silicon carbide cathode FEA was studied in a scanning electron microscope.
KW - field electron emission
KW - field emitter array
KW - high-voltage narrow pulses
KW - pre-breakdown
KW - silicon carbide
UR - https://link.springer.com/article/10.1134/S1063784224070314
UR - https://www.mendeley.com/catalogue/f2c413f5-183d-31f5-9584-0f293cb1c8e2/
U2 - 10.1134/s1063784224070314
DO - 10.1134/s1063784224070314
M3 - Article
VL - 69
SP - 2059
EP - 2065
JO - Technical Physics
JF - Technical Physics
SN - 1063-7842
IS - 7
ER -
ID: 126098994