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Characteristics of a Silicon Carbide Field Emission Array under Pre-Breakdown Conditions. / Морозов, Виктор Александрович; Егоров, Николай Васильевич; Трофимов, Василий Валерьевич; Никифоров, Константин Аркадьевич; Закиров, Ильдар Илюсович; Кац, Виктор Михайлович; Ильин, Владимир; Иванов, Алексей.

In: Technical Physics, Vol. 69, No. 7, 27.09.2024, p. 2059-2065.

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@article{76ea9dc36596459c8edebd7d71518e78,
title = "Characteristics of a Silicon Carbide Field Emission Array under Pre-Breakdown Conditions",
abstract = "Abstract: This study assesses promising field electron sources based on silicon carbide monolithic field emission array (FEA). FEA is fabricated on single-crystal wafers of silicon carbide (0001C) 6H-SiC of n-type conductivity using the technology of two-stage reactive ion etching in SF6/O2/Ar atmosphere. To implement conditions close to breakdown, an experimental setup based on high-voltage narrow pulses generating device GKVI-300 was used. A series of nanosecond voltage pulses with amplitudes from 120 to 250 kV was generated. To study the characteristics of the FEA in the pre-breakdown state, the beam of field emitted electrons was separated from the ion torch or cathode plasma, formed in the following breakdown phases, by placing a 50-μm-thick titanium foil under zero potential into the interelectrode gap. Current-voltage characteristics of peak-currents vs. peak-voltages passing through the foil are close to rectilinear in the Fowler–Nordheim coordinates. The current-voltage characteristics plotted for each of the pulses along increasing and decreasing branches show a discrepancy (hysteresis). After the experiments, the silicon carbide cathode FEA was studied in a scanning electron microscope.",
keywords = "field electron emission, field emitter array, high-voltage narrow pulses, pre-breakdown, silicon carbide",
author = "Морозов, {Виктор Александрович} and Егоров, {Николай Васильевич} and Трофимов, {Василий Валерьевич} and Никифоров, {Константин Аркадьевич} and Закиров, {Ильдар Илюсович} and Кац, {Виктор Михайлович} and Владимир Ильин and Алексей Иванов",
year = "2024",
month = sep,
day = "27",
doi = "10.1134/s1063784224070314",
language = "English",
volume = "69",
pages = "2059--2065",
journal = "Technical Physics",
issn = "1063-7842",
publisher = "Pleiades Publishing",
number = "7",

}

RIS

TY - JOUR

T1 - Characteristics of a Silicon Carbide Field Emission Array under Pre-Breakdown Conditions

AU - Морозов, Виктор Александрович

AU - Егоров, Николай Васильевич

AU - Трофимов, Василий Валерьевич

AU - Никифоров, Константин Аркадьевич

AU - Закиров, Ильдар Илюсович

AU - Кац, Виктор Михайлович

AU - Ильин, Владимир

AU - Иванов, Алексей

PY - 2024/9/27

Y1 - 2024/9/27

N2 - Abstract: This study assesses promising field electron sources based on silicon carbide monolithic field emission array (FEA). FEA is fabricated on single-crystal wafers of silicon carbide (0001C) 6H-SiC of n-type conductivity using the technology of two-stage reactive ion etching in SF6/O2/Ar atmosphere. To implement conditions close to breakdown, an experimental setup based on high-voltage narrow pulses generating device GKVI-300 was used. A series of nanosecond voltage pulses with amplitudes from 120 to 250 kV was generated. To study the characteristics of the FEA in the pre-breakdown state, the beam of field emitted electrons was separated from the ion torch or cathode plasma, formed in the following breakdown phases, by placing a 50-μm-thick titanium foil under zero potential into the interelectrode gap. Current-voltage characteristics of peak-currents vs. peak-voltages passing through the foil are close to rectilinear in the Fowler–Nordheim coordinates. The current-voltage characteristics plotted for each of the pulses along increasing and decreasing branches show a discrepancy (hysteresis). After the experiments, the silicon carbide cathode FEA was studied in a scanning electron microscope.

AB - Abstract: This study assesses promising field electron sources based on silicon carbide monolithic field emission array (FEA). FEA is fabricated on single-crystal wafers of silicon carbide (0001C) 6H-SiC of n-type conductivity using the technology of two-stage reactive ion etching in SF6/O2/Ar atmosphere. To implement conditions close to breakdown, an experimental setup based on high-voltage narrow pulses generating device GKVI-300 was used. A series of nanosecond voltage pulses with amplitudes from 120 to 250 kV was generated. To study the characteristics of the FEA in the pre-breakdown state, the beam of field emitted electrons was separated from the ion torch or cathode plasma, formed in the following breakdown phases, by placing a 50-μm-thick titanium foil under zero potential into the interelectrode gap. Current-voltage characteristics of peak-currents vs. peak-voltages passing through the foil are close to rectilinear in the Fowler–Nordheim coordinates. The current-voltage characteristics plotted for each of the pulses along increasing and decreasing branches show a discrepancy (hysteresis). After the experiments, the silicon carbide cathode FEA was studied in a scanning electron microscope.

KW - field electron emission

KW - field emitter array

KW - high-voltage narrow pulses

KW - pre-breakdown

KW - silicon carbide

UR - https://link.springer.com/article/10.1134/S1063784224070314

UR - https://www.mendeley.com/catalogue/f2c413f5-183d-31f5-9584-0f293cb1c8e2/

U2 - 10.1134/s1063784224070314

DO - 10.1134/s1063784224070314

M3 - Article

VL - 69

SP - 2059

EP - 2065

JO - Technical Physics

JF - Technical Physics

SN - 1063-7842

IS - 7

ER -

ID: 126098994