Standard

Basic elements of information expert system for parameter identification of dielectric response. / Egorov, N. V.; Karpov, A. G.

In: Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, No. 5, 21.09.2005, p. 69-76.

Research output: Contribution to journal › Article › peer-review

Harvard

Egorov, NV & Karpov, AG 2005, 'Basic elements of information expert system for parameter identification of dielectric response', Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, no. 5, pp. 69-76.

APA

Egorov, N. V., & Karpov, A. G. (2005). Basic elements of information expert system for parameter identification of dielectric response. Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, (5), 69-76.

Vancouver

Egorov NV, Karpov AG. Basic elements of information expert system for parameter identification of dielectric response. Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya. 2005 Sep 21;(5):69-76.

Author

Egorov, N. V. ; Karpov, A. G. / Basic elements of information expert system for parameter identification of dielectric response. In: Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya. 2005 ; No. 5. pp. 69-76.

BibTeX

@article{7810a429fada4a03af9842b20612a0f5,
title = "Basic elements of information expert system for parameter identification of dielectric response",
abstract = "The elements of information expert system for structure and parameters identification are considered for models of dielectric thin films and surface layers. Technique of model structure identification is the usage of information expert system for flexible changing of model and the following comparative estimates of parameter identification results for different models. The parameter identification is performed with nonlinear complex least squares fitting to model. The models are equivalent circuits involving linear and nonlinear elements.",
author = "Egorov, {N. V.} and Karpov, {A. G.}",
year = "2005",
month = sep,
day = "21",
language = "русский",
pages = "69--76",
journal = "ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ",
issn = "1027-4510",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "5",

}

RIS

TY - JOUR

T1 - Basic elements of information expert system for parameter identification of dielectric response

AU - Egorov, N. V.

AU - Karpov, A. G.

PY - 2005/9/21

Y1 - 2005/9/21

N2 - The elements of information expert system for structure and parameters identification are considered for models of dielectric thin films and surface layers. Technique of model structure identification is the usage of information expert system for flexible changing of model and the following comparative estimates of parameter identification results for different models. The parameter identification is performed with nonlinear complex least squares fitting to model. The models are equivalent circuits involving linear and nonlinear elements.

AB - The elements of information expert system for structure and parameters identification are considered for models of dielectric thin films and surface layers. Technique of model structure identification is the usage of information expert system for flexible changing of model and the following comparative estimates of parameter identification results for different models. The parameter identification is performed with nonlinear complex least squares fitting to model. The models are equivalent circuits involving linear and nonlinear elements.

UR - http://www.scopus.com/inward/record.url?scp=24744459014&partnerID=8YFLogxK

M3 - статья

AN - SCOPUS:24744459014

SP - 69

EP - 76

JO - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

JF - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

SN - 1027-4510

IS - 5

ER -

ID: 49549763