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Backscattering of a high-intensity ultrashort laser pulse from a solid target at oblique incidence. / Andreev, A. A.; Komarov, V. M.; Charukhchev, A. V.; Platonov, K. Yu.

In: Optics and Spectroscopy (English translation of Optika i Spektroskopiya), Vol. 102, No. 6, 06.2007, p. 944-948.

Research output: Contribution to journalArticlepeer-review

Harvard

Andreev, AA, Komarov, VM, Charukhchev, AV & Platonov, KY 2007, 'Backscattering of a high-intensity ultrashort laser pulse from a solid target at oblique incidence', Optics and Spectroscopy (English translation of Optika i Spektroskopiya), vol. 102, no. 6, pp. 944-948. https://doi.org/10.1134/S0030400X07060227

APA

Andreev, A. A., Komarov, V. M., Charukhchev, A. V., & Platonov, K. Y. (2007). Backscattering of a high-intensity ultrashort laser pulse from a solid target at oblique incidence. Optics and Spectroscopy (English translation of Optika i Spektroskopiya), 102(6), 944-948. https://doi.org/10.1134/S0030400X07060227

Vancouver

Andreev AA, Komarov VM, Charukhchev AV, Platonov KY. Backscattering of a high-intensity ultrashort laser pulse from a solid target at oblique incidence. Optics and Spectroscopy (English translation of Optika i Spektroskopiya). 2007 Jun;102(6):944-948. https://doi.org/10.1134/S0030400X07060227

Author

Andreev, A. A. ; Komarov, V. M. ; Charukhchev, A. V. ; Platonov, K. Yu. / Backscattering of a high-intensity ultrashort laser pulse from a solid target at oblique incidence. In: Optics and Spectroscopy (English translation of Optika i Spektroskopiya). 2007 ; Vol. 102, No. 6. pp. 944-948.

BibTeX

@article{341a1f20aec54b268e5bf50cc321abb8,
title = "Backscattering of a high-intensity ultrashort laser pulse from a solid target at oblique incidence",
abstract = "The results of experimental measurement and analytical estimation of the coefficient of backward reflection from targets made of various materials upon their irradiation by a picosecond laser pulse having the intensity of (0.8-4) × 1018 W/cm2 are presented. It is shown that the induced surface instability leads to the formation of a profile backscattering the incident radiation. The coefficient of backward reflection achieves a few percent and has an intensity optimum depending on the target material.",
author = "Andreev, {A. A.} and Komarov, {V. M.} and Charukhchev, {A. V.} and Platonov, {K. Yu}",
year = "2007",
month = jun,
doi = "10.1134/S0030400X07060227",
language = "English",
volume = "102",
pages = "944--948",
journal = "OPTICS AND SPECTROSCOPY",
issn = "0030-400X",
publisher = "Pleiades Publishing",
number = "6",

}

RIS

TY - JOUR

T1 - Backscattering of a high-intensity ultrashort laser pulse from a solid target at oblique incidence

AU - Andreev, A. A.

AU - Komarov, V. M.

AU - Charukhchev, A. V.

AU - Platonov, K. Yu

PY - 2007/6

Y1 - 2007/6

N2 - The results of experimental measurement and analytical estimation of the coefficient of backward reflection from targets made of various materials upon their irradiation by a picosecond laser pulse having the intensity of (0.8-4) × 1018 W/cm2 are presented. It is shown that the induced surface instability leads to the formation of a profile backscattering the incident radiation. The coefficient of backward reflection achieves a few percent and has an intensity optimum depending on the target material.

AB - The results of experimental measurement and analytical estimation of the coefficient of backward reflection from targets made of various materials upon their irradiation by a picosecond laser pulse having the intensity of (0.8-4) × 1018 W/cm2 are presented. It is shown that the induced surface instability leads to the formation of a profile backscattering the incident radiation. The coefficient of backward reflection achieves a few percent and has an intensity optimum depending on the target material.

UR - http://www.scopus.com/inward/record.url?scp=34547334444&partnerID=8YFLogxK

U2 - 10.1134/S0030400X07060227

DO - 10.1134/S0030400X07060227

M3 - Article

AN - SCOPUS:34547334444

VL - 102

SP - 944

EP - 948

JO - OPTICS AND SPECTROSCOPY

JF - OPTICS AND SPECTROSCOPY

SN - 0030-400X

IS - 6

ER -

ID: 85666812