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Automated test development system for digital devices. / Grishkin, Valery M.; Ovsyannikov, Dmitry A.; Yelaev, Yevgeny V.; Maschinskiy, Nikolay S.

Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings. Vol. 2018-March Institute of Electrical and Electronics Engineers Inc., 2018. p. 1-4 8337227.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Harvard

Grishkin, VM, Ovsyannikov, DA, Yelaev, YV & Maschinskiy, NS 2018, Automated test development system for digital devices. in Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings. vol. 2018-March, 8337227, Institute of Electrical and Electronics Engineers Inc., pp. 1-4, 1st Moscow Workshop on Electronic and Networking Technologies, MWENT 2018, Moscow, Russian Federation, 14/03/18. https://doi.org/10.1109/MWENT.2018.8337227

APA

Grishkin, V. M., Ovsyannikov, D. A., Yelaev, Y. V., & Maschinskiy, N. S. (2018). Automated test development system for digital devices. In Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings (Vol. 2018-March, pp. 1-4). [8337227] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWENT.2018.8337227

Vancouver

Grishkin VM, Ovsyannikov DA, Yelaev YV, Maschinskiy NS. Automated test development system for digital devices. In Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings. Vol. 2018-March. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1-4. 8337227 https://doi.org/10.1109/MWENT.2018.8337227

Author

Grishkin, Valery M. ; Ovsyannikov, Dmitry A. ; Yelaev, Yevgeny V. ; Maschinskiy, Nikolay S. / Automated test development system for digital devices. Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings. Vol. 2018-March Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1-4

BibTeX

@inproceedings{064cc469fb264fb1a034e990c1e479c3,
title = "Automated test development system for digital devices",
abstract = "The system of computer-aided test development is proposed in the article. The system operation is based on the model of digital device, also system allows to form test as a set of input actions and reactions of model to them. The technology for creating and debugging of tests provides a predetermined test coverage. Input actions are formed according to the interface approach. The interface approach allows to work with the model of digital device at the transaction level, but not at the signal level. This method greatly simplifies and accelerates the process of searching for test sequences. The proposed system structure supports the suggested technology and implements search of test sequences with a predetermined coverage criterion. The developed methodology allows to create a test check programs and diagnostics test program of the digital device, without any information about the destination and operation algorithm of a control object. The system checks the digital device serviceability and its operational suitability.",
keywords = "automatic test pattern generation, digital devices, Electronic equipment testing, integrated circuit testing, test check",
author = "Grishkin, {Valery M.} and Ovsyannikov, {Dmitry A.} and Yelaev, {Yevgeny V.} and Maschinskiy, {Nikolay S.}",
year = "2018",
month = apr,
day = "12",
doi = "10.1109/MWENT.2018.8337227",
language = "English",
volume = "2018-March",
pages = "1--4",
booktitle = "Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "1st Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 ; Conference date: 14-03-2018 Through 16-03-2018",

}

RIS

TY - GEN

T1 - Automated test development system for digital devices

AU - Grishkin, Valery M.

AU - Ovsyannikov, Dmitry A.

AU - Yelaev, Yevgeny V.

AU - Maschinskiy, Nikolay S.

PY - 2018/4/12

Y1 - 2018/4/12

N2 - The system of computer-aided test development is proposed in the article. The system operation is based on the model of digital device, also system allows to form test as a set of input actions and reactions of model to them. The technology for creating and debugging of tests provides a predetermined test coverage. Input actions are formed according to the interface approach. The interface approach allows to work with the model of digital device at the transaction level, but not at the signal level. This method greatly simplifies and accelerates the process of searching for test sequences. The proposed system structure supports the suggested technology and implements search of test sequences with a predetermined coverage criterion. The developed methodology allows to create a test check programs and diagnostics test program of the digital device, without any information about the destination and operation algorithm of a control object. The system checks the digital device serviceability and its operational suitability.

AB - The system of computer-aided test development is proposed in the article. The system operation is based on the model of digital device, also system allows to form test as a set of input actions and reactions of model to them. The technology for creating and debugging of tests provides a predetermined test coverage. Input actions are formed according to the interface approach. The interface approach allows to work with the model of digital device at the transaction level, but not at the signal level. This method greatly simplifies and accelerates the process of searching for test sequences. The proposed system structure supports the suggested technology and implements search of test sequences with a predetermined coverage criterion. The developed methodology allows to create a test check programs and diagnostics test program of the digital device, without any information about the destination and operation algorithm of a control object. The system checks the digital device serviceability and its operational suitability.

KW - automatic test pattern generation

KW - digital devices

KW - Electronic equipment testing

KW - integrated circuit testing

KW - test check

UR - http://www.scopus.com/inward/record.url?scp=85051085538&partnerID=8YFLogxK

U2 - 10.1109/MWENT.2018.8337227

DO - 10.1109/MWENT.2018.8337227

M3 - Conference contribution

AN - SCOPUS:85051085538

VL - 2018-March

SP - 1

EP - 4

BT - Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 1st Moscow Workshop on Electronic and Networking Technologies, MWENT 2018

Y2 - 14 March 2018 through 16 March 2018

ER -

ID: 32724765