Standard

AgI thin films prepared by laser ablation. / Fokina, Svetlana V.; Borisov, Eugene N.; Tomaev, Vladimir V.; Tumkin, Ilya I.; Tveryanovich, Yuri S.

In: Solid State Ionics, Vol. 297, 2016, p. 64-67.

Research output: Contribution to journal › Article

Harvard

Fokina, SV, Borisov, EN, Tomaev, VV, Tumkin, II & Tveryanovich, YS 2016, 'AgI thin films prepared by laser ablation', Solid State Ionics, vol. 297, pp. 64-67. https://doi.org/10.1016/j.ssi.2016.10.004

APA

Fokina, S. V., Borisov, E. N., Tomaev, V. V., Tumkin, I. I., & Tveryanovich, Y. S. (2016). AgI thin films prepared by laser ablation. Solid State Ionics, 297, 64-67. https://doi.org/10.1016/j.ssi.2016.10.004

Vancouver

Fokina SV, Borisov EN, Tomaev VV, Tumkin II, Tveryanovich YS. AgI thin films prepared by laser ablation. Solid State Ionics. 2016;297:64-67. https://doi.org/10.1016/j.ssi.2016.10.004

Author

Fokina, Svetlana V. ; Borisov, Eugene N. ; Tomaev, Vladimir V. ; Tumkin, Ilya I. ; Tveryanovich, Yuri S. / AgI thin films prepared by laser ablation. In: Solid State Ionics. 2016 ; Vol. 297. pp. 64-67.

BibTeX

@article{ce98c7c93c9f4211aab5d197444610da,
title = "AgI thin films prepared by laser ablation",
abstract = "High quality and uniform morphology AgI films consisting of crystal grains about 30 nm in size were obtained by the laser (XeCl) ablation method. The designed silver iodide films have crystalline structure, optical and electrical properties corresponding to stoichiometric compound films. We have demonstrated that the laser ablation method commonly used for the preparation of thin films and nanolayered structures with the defined thickness can be successfully used for the deposition of AgI superionic conductor layers as well. The films were studied by XRD, EDA, optical absorption, photoluminescence, and impedance spectroscopies.",
keywords = "AgI, Thin films, Laser ablation, Conductivity, Optical band gap, Luminescence, Morphology, Excitons, XRD, Electron microscopy.",
author = "Fokina, {Svetlana V.} and Borisov, {Eugene N.} and Tomaev, {Vladimir V.} and Tumkin, {Ilya I.} and Tveryanovich, {Yuri S.}",
year = "2016",
doi = "10.1016/j.ssi.2016.10.004",
language = "English",
volume = "297",
pages = "64--67",
journal = "Solid State Ionics",
issn = "0167-2738",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - AgI thin films prepared by laser ablation

AU - Fokina, Svetlana V.

AU - Borisov, Eugene N.

AU - Tomaev, Vladimir V.

AU - Tumkin, Ilya I.

AU - Tveryanovich, Yuri S.

PY - 2016

Y1 - 2016

N2 - High quality and uniform morphology AgI films consisting of crystal grains about 30 nm in size were obtained by the laser (XeCl) ablation method. The designed silver iodide films have crystalline structure, optical and electrical properties corresponding to stoichiometric compound films. We have demonstrated that the laser ablation method commonly used for the preparation of thin films and nanolayered structures with the defined thickness can be successfully used for the deposition of AgI superionic conductor layers as well. The films were studied by XRD, EDA, optical absorption, photoluminescence, and impedance spectroscopies.

AB - High quality and uniform morphology AgI films consisting of crystal grains about 30 nm in size were obtained by the laser (XeCl) ablation method. The designed silver iodide films have crystalline structure, optical and electrical properties corresponding to stoichiometric compound films. We have demonstrated that the laser ablation method commonly used for the preparation of thin films and nanolayered structures with the defined thickness can be successfully used for the deposition of AgI superionic conductor layers as well. The films were studied by XRD, EDA, optical absorption, photoluminescence, and impedance spectroscopies.

KW - AgI

KW - Thin films

KW - Laser ablation

KW - Conductivity

KW - Optical band gap

KW - Luminescence

KW - Morphology

KW - Excitons

KW - XRD

KW - Electron microscopy.

U2 - 10.1016/j.ssi.2016.10.004

DO - 10.1016/j.ssi.2016.10.004

M3 - Article

VL - 297

SP - 64

EP - 67

JO - Solid State Ionics

JF - Solid State Ionics

SN - 0167-2738

ER -

ID: 7598098