Standard

Accounting for the plasma background radiation influence and calibration curve export in atomic emission spectrometry with CCD-based registration system when determining metal and alloy impurities. / Sukhomlinov, V. S.; Mustafaev, A. S.; Popova, A. N.

In: Journal of Physics: Conference Series, Vol. 1753, No. 1, 012044, 01.02.2021.

Research output: Contribution to journal › Conference article › peer-review

Harvard

Sukhomlinov, VS, Mustafaev, AS & Popova, AN 2021, 'Accounting for the plasma background radiation influence and calibration curve export in atomic emission spectrometry with CCD-based registration system when determining metal and alloy impurities', Journal of Physics: Conference Series, vol. 1753, no. 1, 012044. https://doi.org/10.1088/1742-6596/1753/1/012044

APA

Sukhomlinov, V. S., Mustafaev, A. S., & Popova, A. N. (2021). Accounting for the plasma background radiation influence and calibration curve export in atomic emission spectrometry with CCD-based registration system when determining metal and alloy impurities. Journal of Physics: Conference Series, 1753(1), [012044]. https://doi.org/10.1088/1742-6596/1753/1/012044

Vancouver

Sukhomlinov VS, Mustafaev AS, Popova AN. Accounting for the plasma background radiation influence and calibration curve export in atomic emission spectrometry with CCD-based registration system when determining metal and alloy impurities. Journal of Physics: Conference Series. 2021 Feb 1;1753(1). 012044. https://doi.org/10.1088/1742-6596/1753/1/012044

Author

Sukhomlinov, V. S. ; Mustafaev, A. S. ; Popova, A. N. / Accounting for the plasma background radiation influence and calibration curve export in atomic emission spectrometry with CCD-based registration system when determining metal and alloy impurities. In: Journal of Physics: Conference Series. 2021 ; Vol. 1753, No. 1.

BibTeX

@article{0a110d2911fe49d5930fde7a9d69939d,
title = "Accounting for the plasma background radiation influence and calibration curve export in atomic emission spectrometry with CCD-based registration system when determining metal and alloy impurities",
abstract = "This paper is dedicated to development and application of an algorithm allowing determining an accurate actual value of the plasma background radiation under the analytic element line using standard data obtained from emission spectrometer registration system. A unique technique has been developed that allows calibrating spectrometers in the range of small concentration of impurities with two standard samples, which is very relevant for analysis of metals and alloys, powdered samples, ultrapure materials. The paper demonstrates efficiency of this technique when applied to series-produced emission spectrometers manufactured in Russia. ",
author = "Sukhomlinov, {V. S.} and Mustafaev, {A. S.} and Popova, {A. N.}",
note = "Publisher Copyright: {\textcopyright} Published under licence by IOP Publishing Ltd.; International Conference on Innovations, Physical Studies and Digitalization in Mining Engineering 2020, IPDME 2020 ; Conference date: 23-04-2020 Through 24-04-2020",
year = "2021",
month = feb,
day = "1",
doi = "10.1088/1742-6596/1753/1/012044",
language = "English",
volume = "1753",
journal = "Journal of Physics: Conference Series",
issn = "1742-6588",
publisher = "IOP Publishing Ltd.",
number = "1",

}

RIS

TY - JOUR

T1 - Accounting for the plasma background radiation influence and calibration curve export in atomic emission spectrometry with CCD-based registration system when determining metal and alloy impurities

AU - Sukhomlinov, V. S.

AU - Mustafaev, A. S.

AU - Popova, A. N.

N1 - Publisher Copyright: © Published under licence by IOP Publishing Ltd.

PY - 2021/2/1

Y1 - 2021/2/1

N2 - This paper is dedicated to development and application of an algorithm allowing determining an accurate actual value of the plasma background radiation under the analytic element line using standard data obtained from emission spectrometer registration system. A unique technique has been developed that allows calibrating spectrometers in the range of small concentration of impurities with two standard samples, which is very relevant for analysis of metals and alloys, powdered samples, ultrapure materials. The paper demonstrates efficiency of this technique when applied to series-produced emission spectrometers manufactured in Russia.

AB - This paper is dedicated to development and application of an algorithm allowing determining an accurate actual value of the plasma background radiation under the analytic element line using standard data obtained from emission spectrometer registration system. A unique technique has been developed that allows calibrating spectrometers in the range of small concentration of impurities with two standard samples, which is very relevant for analysis of metals and alloys, powdered samples, ultrapure materials. The paper demonstrates efficiency of this technique when applied to series-produced emission spectrometers manufactured in Russia.

UR - http://www.scopus.com/inward/record.url?scp=85102206185&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/1753/1/012044

DO - 10.1088/1742-6596/1753/1/012044

M3 - Conference article

AN - SCOPUS:85102206185

VL - 1753

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

M1 - 012044

T2 - International Conference on Innovations, Physical Studies and Digitalization in Mining Engineering 2020, IPDME 2020

Y2 - 23 April 2020 through 24 April 2020

ER -

ID: 87768996