DOI

This research focuses on the development of a new technique of emission spectral analysis designed to accurately account for the background radiation. The technique enables the evaluation of background radiation while being unaffected by its spectral shape. This is possible through the use of standard data obtained in an analytical-line-recording process performed by light-intensity-to-electric-signal converters such as CCDs, PMTs, photodiodes, etc. This technique, when applied at a set RMS deviation of the analytical-line-radiation intensity, reduces the random error of a determined low impure-element concentration due to the optimal calibration-line slope. In areas of high concentrations, an accurate accounting of the background does little to affect the emission spectrometer’s measurement accuracy. This technique also allows the replication of calibration curves in spectrometers of the same type by a linear-intensity conversion with only two standard samples required. The technique was tested on SPAS-02 and SPAS-05 commercial spark spectrometers. The testing fully confirmed the aforementioned advantages of the developed technique. The authors also determined the applicability conditions of the conventional emission-spectrometer-recalibration method by a linear conversion of the analytical-line intensity.

Original languageEnglish
Article number2896
Number of pages16
JournalApplied Sciences (Switzerland)
Volume12
Issue number6
DOIs
StatePublished - 11 Mar 2022

    Research areas

  • Calibration, Charge-coupled image sensors, Impurities, Metrology, Plasma devices, Spectral analysis, Spectroscopy, impurities, spectral analysis, metrology, plasma devices, spectroscopy, calibration, charge-coupled image sensors

    Scopus subject areas

  • Engineering(all)
  • Instrumentation
  • Materials Science(all)
  • Fluid Flow and Transfer Processes
  • Process Chemistry and Technology
  • Computer Science Applications

ID: 94435050