Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
A linear regression model for the field emission signal. / Lifantova, Ekaterina E.; Varayun, Marina I.; Antonov, Andrei Yu.
2016 Young Researchers in Vacuum Micro/Nano Electronics, VMNE-YR 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. 7880407.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
}
TY - GEN
T1 - A linear regression model for the field emission signal
AU - Lifantova, Ekaterina E.
AU - Varayun, Marina I.
AU - Antonov, Andrei Yu
PY - 2017/3/16
Y1 - 2017/3/16
N2 - In the paper the problem of constructing a linear regression model to estimate the parameters of the integral Fowler-Nordheim equation is considered. Numerical modeling of the field emission current with a normally distributed noise is carried out. Based on the method of least squares, estimates of the parameters of the Fowler-Nordheim equation are constructed. The application of statistical tests showed that in most cases the remains of a linear regression model are normally distributed, in spite of the logarithmic transformation of the integrated current-voltage characteristics. In a sense, the results are justify the applicability of the convenient methods of linear regression analysis to estimate the parameters of the I-V curve.
AB - In the paper the problem of constructing a linear regression model to estimate the parameters of the integral Fowler-Nordheim equation is considered. Numerical modeling of the field emission current with a normally distributed noise is carried out. Based on the method of least squares, estimates of the parameters of the Fowler-Nordheim equation are constructed. The application of statistical tests showed that in most cases the remains of a linear regression model are normally distributed, in spite of the logarithmic transformation of the integrated current-voltage characteristics. In a sense, the results are justify the applicability of the convenient methods of linear regression analysis to estimate the parameters of the I-V curve.
UR - http://www.scopus.com/inward/record.url?scp=85017216192&partnerID=8YFLogxK
U2 - 10.1109/VMNEYR.2016.7880407
DO - 10.1109/VMNEYR.2016.7880407
M3 - Conference contribution
AN - SCOPUS:85017216192
BT - 2016 Young Researchers in Vacuum Micro/Nano Electronics, VMNE-YR 2016 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 Young Researchers in Vacuum Micro/Nano Electronics, VMNE-YR 2016
Y2 - 4 October 2016 through 5 October 2016
ER -
ID: 9425010