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1Tendencies of Dependencies Between Psychometric Tests Results and Holland Code among VK Users. / Glushkov, E.; Stoliarova, V.

2025. 36-38 Paper presented at XXVIII International Conference on Soft Computing and Measurements (SCM), Saint Petersburg, Russian Federation.

Research output: Contribution to conference › Paper › peer-review

Harvard

Glushkov, E & Stoliarova, V 2025, '1Tendencies of Dependencies Between Psychometric Tests Results and Holland Code among VK Users', Paper presented at XXVIII International Conference on Soft Computing and Measurements (SCM), Saint Petersburg, Russian Federation, 28/05/25 - 30/05/25 pp. 36-38. https://doi.org/10.1109/SCM66446.2025.11060327

APA

Glushkov, E., & Stoliarova, V. (2025). 1Tendencies of Dependencies Between Psychometric Tests Results and Holland Code among VK Users. 36-38. Paper presented at XXVIII International Conference on Soft Computing and Measurements (SCM), Saint Petersburg, Russian Federation. https://doi.org/10.1109/SCM66446.2025.11060327

Vancouver

Glushkov E, Stoliarova V. 1Tendencies of Dependencies Between Psychometric Tests Results and Holland Code among VK Users. 2025. Paper presented at XXVIII International Conference on Soft Computing and Measurements (SCM), Saint Petersburg, Russian Federation. https://doi.org/10.1109/SCM66446.2025.11060327

Author

Glushkov, E. ; Stoliarova, V. / 1Tendencies of Dependencies Between Psychometric Tests Results and Holland Code among VK Users. Paper presented at XXVIII International Conference on Soft Computing and Measurements (SCM), Saint Petersburg, Russian Federation.3 p.

BibTeX

@conference{c33ee7cc6a4e4ab486e4137fb63bac40,
title = "1Tendencies of Dependencies Between Psychometric Tests Results and Holland Code among VK Users",
author = "E. Glushkov and V. Stoliarova",
note = "Export Date: 26 January 2026; Cited By: 0; Conference name: 28th IEEE International Conference on Soft Computing and Measurements, SCM 2025; Conference location: St. Petersburg; Conference date: 2025-03-28 through 2025-03-30; XXVIII International Conference on Soft Computing and Measurements (SCM) ; Conference date: 28-05-2025 Through 30-05-2025",
year = "2025",
doi = "10.1109/SCM66446.2025.11060327",
language = "English",
pages = "36--38",

}

RIS

TY - CONF

T1 - 1Tendencies of Dependencies Between Psychometric Tests Results and Holland Code among VK Users

AU - Glushkov, E.

AU - Stoliarova, V.

N1 - Export Date: 26 January 2026; Cited By: 0; Conference name: 28th IEEE International Conference on Soft Computing and Measurements, SCM 2025; Conference location: St. Petersburg; Conference date: 2025-03-28 through 2025-03-30

PY - 2025

Y1 - 2025

U2 - 10.1109/SCM66446.2025.11060327

DO - 10.1109/SCM66446.2025.11060327

M3 - Paper

SP - 36

EP - 38

T2 - XXVIII International Conference on Soft Computing and Measurements (SCM)

Y2 - 28 May 2025 through 30 May 2025

ER -

ID: 147895668