The issue of the contribution from thin surface layers to reflection spectra is considered. The reflection coefficients for the two polarizations of the incident radiation are calculated taking into account the surface-layer anisotropy. It is shown that results obtained are important for use in the modern method of infrared reflection–absorption spectroscopy. The obtained solution is shown to be a generalization of a previously developed approach, which has become widespread, to the case of absorption.
Original languageRussian
Pages (from-to)416-421
JournalОПТИКА И СПЕКТРОСКОПИЯ
Volume128
Issue number3
DOIs
StatePublished - 2020

ID: 78521157