1. 2025
  2. The Evaluation of the Effect of Charged Particle Concentration on the Breakdown Voltage

    Mugu, A. I., Samusenko, A. V., Nasyrov, R. (ed.) & Tolba, M. A. (ed.), 2025.

    Research output: Contribution to conferencePaperpeer-review

  3. 2023
  4. Double ground fault resistance

    Mugu, A. I., 2023, Proceedings of the 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering. p. 941-943

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  5. 2021

ID: 13760393