Time-of-flight mass spectrometry with pulsed gas-discharge ionization

Study of relative sensitivities of components

A. A. Ganeev, A. R. Gubal', S. V. Potapov, R. V. Tyukal'tsev

Результат исследований: Научные публикации в периодических изданияхстатьянаучнаярецензирование

13 Цитирования (Scopus)

Выдержка

The potential of the relative sensitivity method was assessed for the direct analysis of solid samples using time-of-flight mass spectrometry with pulsed glow discharge ionization in a combined hollow cathode. Relative sensitivity factors of sample elements were obtained for various samples (copper, steel, nickel, lead, and silicon). For the majority of elements, these factors appeared to be close to unity. The factors were compared with the similar data obtained for direct current (DC) glow discharge; the range of factors obtained in the present work was significantly narrower. This opens up new prospects for pulsed gas-discharge ionization in semiquantitative analysis without using certified reference samples strictly corresponding to the test sample in composition and structure.

Язык оригиналаанглийский
Страницы (с-по)696-704
Число страниц9
ЖурналJournal of Analytical Chemistry
Том64
Номер выпуска7
DOI
СостояниеОпубликовано - 1 июл 2009

Отпечаток

Glow discharges
Ionization
Mass spectrometry
Gases
Steel
Silicon
Nickel
Copper
Cathodes
Chemical analysis
Lead

Предметные области Scopus

  • Аналитическая химия

Цитировать

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Time-of-flight mass spectrometry with pulsed gas-discharge ionization : Study of relative sensitivities of components. / Ganeev, A. A.; Gubal', A. R.; Potapov, S. V.; Tyukal'tsev, R. V.

В: Journal of Analytical Chemistry, Том 64, № 7, 01.07.2009, стр. 696-704.

Результат исследований: Научные публикации в периодических изданияхстатьянаучнаярецензирование

TY - JOUR

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AU - Gubal', A. R.

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AU - Tyukal'tsev, R. V.

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