The electronic structure formation of CuxTiSe2 in a wide range (0.04 <x <0.8) of copper concentration

A. S. Shkvarin, Yu. M. Yarmoshenko, M. V. Yablonskikh, A. I. Merentsov, E. G. Shkvarina, A. A. Titov, Yu. M. Zhukov, A. N. Titov

Результат исследований: Научные публикации в периодических изданияхстатья

Выдержка

An experimental study of the electronic structure of copper intercalated titanium dichalcogenides in a wide range of copper concentrations (x = 0.04–0.8) using x-ray photoelectron spectroscopy, resonant photoelectron spectroscopy, and x-ray absorption spectroscopy has been performed. Shift towards low energies of the Ti 2p and Se 3d core level spectra and a corresponding decrease in the photon energy of Ti 2p absorption spectra with the increase in copper concentration have been found. These sign-anomalous shifts may be explained by the shielding effect of the corresponding atomic shells as a result of the dynamic charge transfer during the formation of a covalent chemical bond between the copper atoms and the TiSe2 matrix.
Язык оригиналане определен
ЖурналJournal of Chemical Physics
Том144
СостояниеОпубликовано - 2016
Опубликовано для внешнего пользованияДа

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Shkvarin, A. S., Yarmoshenko, Y. M., Yablonskikh, M. V., Merentsov, A. I., Shkvarina, E. G., Titov, A. A., ... Titov, A. N. (2016). The electronic structure formation of CuxTiSe2 in a wide range (0.04 <x <0.8) of copper concentration. Journal of Chemical Physics, 144.
Shkvarin, A. S. ; Yarmoshenko, Yu. M. ; Yablonskikh, M. V. ; Merentsov, A. I. ; Shkvarina, E. G. ; Titov, A. A. ; Zhukov, Yu. M. ; Titov, A. N. / The electronic structure formation of CuxTiSe2 in a wide range (0.04 <x <0.8) of copper concentration. В: Journal of Chemical Physics. 2016 ; Том 144.
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title = "The electronic structure formation of CuxTiSe2 in a wide range (0.04 <x <0.8) of copper concentration",
abstract = "An experimental study of the electronic structure of copper intercalated titanium dichalcogenides in a wide range of copper concentrations (x = 0.04–0.8) using x-ray photoelectron spectroscopy, resonant photoelectron spectroscopy, and x-ray absorption spectroscopy has been performed. Shift towards low energies of the Ti 2p and Se 3d core level spectra and a corresponding decrease in the photon energy of Ti 2p absorption spectra with the increase in copper concentration have been found. These sign-anomalous shifts may be explained by the shielding effect of the corresponding atomic shells as a result of the dynamic charge transfer during the formation of a covalent chemical bond between the copper atoms and the TiSe2 matrix.",
keywords = "Copper Absorption spectra X-ray photoelectron spectroscopy Charge transfer Titanium",
author = "Shkvarin, {A. S.} and Yarmoshenko, {Yu. M.} and Yablonskikh, {M. V.} and Merentsov, {A. I.} and Shkvarina, {E. G.} and Titov, {A. A.} and Zhukov, {Yu. M.} and Titov, {A. N.}",
year = "2016",
language = "не определен",
volume = "144",
journal = "Journal of Chemical Physics",
issn = "0021-9606",
publisher = "American Institute of Physics",

}

Shkvarin, AS, Yarmoshenko, YM, Yablonskikh, MV, Merentsov, AI, Shkvarina, EG, Titov, AA, Zhukov, YM & Titov, AN 2016, 'The electronic structure formation of CuxTiSe2 in a wide range (0.04 <x <0.8) of copper concentration', Journal of Chemical Physics, том. 144.

The electronic structure formation of CuxTiSe2 in a wide range (0.04 <x <0.8) of copper concentration. / Shkvarin, A. S.; Yarmoshenko, Yu. M.; Yablonskikh, M. V.; Merentsov, A. I.; Shkvarina, E. G.; Titov, A. A.; Zhukov, Yu. M.; Titov, A. N.

В: Journal of Chemical Physics, Том 144, 2016.

Результат исследований: Научные публикации в периодических изданияхстатья

TY - JOUR

T1 - The electronic structure formation of CuxTiSe2 in a wide range (0.04 <x <0.8) of copper concentration

AU - Shkvarin, A. S.

AU - Yarmoshenko, Yu. M.

AU - Yablonskikh, M. V.

AU - Merentsov, A. I.

AU - Shkvarina, E. G.

AU - Titov, A. A.

AU - Zhukov, Yu. M.

AU - Titov, A. N.

PY - 2016

Y1 - 2016

N2 - An experimental study of the electronic structure of copper intercalated titanium dichalcogenides in a wide range of copper concentrations (x = 0.04–0.8) using x-ray photoelectron spectroscopy, resonant photoelectron spectroscopy, and x-ray absorption spectroscopy has been performed. Shift towards low energies of the Ti 2p and Se 3d core level spectra and a corresponding decrease in the photon energy of Ti 2p absorption spectra with the increase in copper concentration have been found. These sign-anomalous shifts may be explained by the shielding effect of the corresponding atomic shells as a result of the dynamic charge transfer during the formation of a covalent chemical bond between the copper atoms and the TiSe2 matrix.

AB - An experimental study of the electronic structure of copper intercalated titanium dichalcogenides in a wide range of copper concentrations (x = 0.04–0.8) using x-ray photoelectron spectroscopy, resonant photoelectron spectroscopy, and x-ray absorption spectroscopy has been performed. Shift towards low energies of the Ti 2p and Se 3d core level spectra and a corresponding decrease in the photon energy of Ti 2p absorption spectra with the increase in copper concentration have been found. These sign-anomalous shifts may be explained by the shielding effect of the corresponding atomic shells as a result of the dynamic charge transfer during the formation of a covalent chemical bond between the copper atoms and the TiSe2 matrix.

KW - Copper Absorption spectra X-ray photoelectron spectroscopy Charge transfer Titanium

M3 - статья

VL - 144

JO - Journal of Chemical Physics

JF - Journal of Chemical Physics

SN - 0021-9606

ER -

Shkvarin AS, Yarmoshenko YM, Yablonskikh MV, Merentsov AI, Shkvarina EG, Titov AA и соавт. The electronic structure formation of CuxTiSe2 in a wide range (0.04 <x <0.8) of copper concentration. Journal of Chemical Physics. 2016;144.