Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy

M. A. Kanygin, A. V. Okotrub, L. G. Bulusheva, O. Y. Vilkov, K. Hata

Результат исследований: Научные публикации в периодических изданияхстатья

1 цитирование (Scopus)

Выдержка

Arrays of aligned single-walled carbon nanotubes (SWCNTs) produced by supergrowth method were studied by scanning electron microscopy (SEM) and angle-resolved near-edge X-ray absorption fine structure spectroscopy, which defined that nanotube disorder is 10-13° and 23-27°, respectively. The latter value was confirmed by X-ray fluorescent spectroscopy. The difference in the obtained angular deviations was attributed to distortion of the SWCNT walls, because the X-ray spectroscopy methods are sensitive to a local environment of probing atoms, while the SEM examines the nanotubes at a substantially larger length scale. Significant distortion (20-24°) of SWCNT walls could be related to the defects introduced during the growth process.

Язык оригиналаанглийский
Страницы (с-по)1111-1116
Число страниц6
ЖурналCurrent Applied Physics
Том15
Номер выпуска10
DOI
СостояниеОпубликовано - 2015

Отпечаток

Carbon Nanotubes
Single-walled carbon nanotubes (SWCN)
X ray spectroscopy
Carbon nanotubes
carbon nanotubes
Nanotubes
nanotubes
spectroscopy
X ray absorption near edge structure spectroscopy
Scanning electron microscopy
scanning electron microscopy
x rays
fine structure
Spectroscopy
disorders
deviation
X rays
Atoms
Defects
defects

Предметные области Scopus

  • Материаловедение (все)
  • Физика и астрономия (все)

Цитировать

Kanygin, M. A., Okotrub, A. V., Bulusheva, L. G., Vilkov, O. Y., & Hata, K. (2015). Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy. Current Applied Physics, 15(10), 1111-1116. https://doi.org/10.1016/j.cap.2015.06.017
Kanygin, M. A. ; Okotrub, A. V. ; Bulusheva, L. G. ; Vilkov, O. Y. ; Hata, K. / Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy. В: Current Applied Physics. 2015 ; Том 15, № 10. стр. 1111-1116.
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abstract = "Arrays of aligned single-walled carbon nanotubes (SWCNTs) produced by supergrowth method were studied by scanning electron microscopy (SEM) and angle-resolved near-edge X-ray absorption fine structure spectroscopy, which defined that nanotube disorder is 10-13° and 23-27°, respectively. The latter value was confirmed by X-ray fluorescent spectroscopy. The difference in the obtained angular deviations was attributed to distortion of the SWCNT walls, because the X-ray spectroscopy methods are sensitive to a local environment of probing atoms, while the SEM examines the nanotubes at a substantially larger length scale. Significant distortion (20-24°) of SWCNT walls could be related to the defects introduced during the growth process.",
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Kanygin, MA, Okotrub, AV, Bulusheva, LG, Vilkov, OY & Hata, K 2015, 'Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy', Current Applied Physics, том. 15, № 10, стр. 1111-1116. https://doi.org/10.1016/j.cap.2015.06.017

Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy. / Kanygin, M. A.; Okotrub, A. V.; Bulusheva, L. G.; Vilkov, O. Y.; Hata, K.

В: Current Applied Physics, Том 15, № 10, 2015, стр. 1111-1116.

Результат исследований: Научные публикации в периодических изданияхстатья

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AU - Kanygin, M. A.

AU - Okotrub, A. V.

AU - Bulusheva, L. G.

AU - Vilkov, O. Y.

AU - Hata, K.

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AB - Arrays of aligned single-walled carbon nanotubes (SWCNTs) produced by supergrowth method were studied by scanning electron microscopy (SEM) and angle-resolved near-edge X-ray absorption fine structure spectroscopy, which defined that nanotube disorder is 10-13° and 23-27°, respectively. The latter value was confirmed by X-ray fluorescent spectroscopy. The difference in the obtained angular deviations was attributed to distortion of the SWCNT walls, because the X-ray spectroscopy methods are sensitive to a local environment of probing atoms, while the SEM examines the nanotubes at a substantially larger length scale. Significant distortion (20-24°) of SWCNT walls could be related to the defects introduced during the growth process.

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