Standard

Modern developments in theoretical research of field emission. / Egorov, Nikolay; Sheshin, Evgeny.

Springer Series in Advanced Microelectronics. Springer Nature, 2017. стр. 115-169 (Springer Series in Advanced Microelectronics; Том 60).

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › глава/раздел › научная › Рецензирование

Harvard

Egorov, N & Sheshin, E 2017, Modern developments in theoretical research of field emission. в Springer Series in Advanced Microelectronics. Springer Series in Advanced Microelectronics, Том. 60, Springer Nature, стр. 115-169. https://doi.org/10.1007/978-3-319-56561-3_3

APA

Egorov, N., & Sheshin, E. (2017). Modern developments in theoretical research of field emission. в Springer Series in Advanced Microelectronics (стр. 115-169). (Springer Series in Advanced Microelectronics; Том 60). Springer Nature. https://doi.org/10.1007/978-3-319-56561-3_3

Vancouver

Egorov N, Sheshin E. Modern developments in theoretical research of field emission. в Springer Series in Advanced Microelectronics. Springer Nature. 2017. стр. 115-169. (Springer Series in Advanced Microelectronics). https://doi.org/10.1007/978-3-319-56561-3_3

Author

Egorov, Nikolay ; Sheshin, Evgeny. / Modern developments in theoretical research of field emission. Springer Series in Advanced Microelectronics. Springer Nature, 2017. стр. 115-169 (Springer Series in Advanced Microelectronics).

BibTeX

@inbook{9ecbd19547c14f6493967551da728849,
title = "Modern developments in theoretical research of field emission",
abstract = "This chapter discusses modern developments in theoretical research of field emission from metals and semiconductors. Emitter shape approximation and methods of electrostatic potential and field strength calculation are considered. It also presents the theory of thermal-field emission (TFE) from metals. Energy distributions of field electrons and TFE electrons emitted from a metal are considered in terms of applications for field emission spectroscopy. Theoretical aspects of phenomena and processes on the emitter surface during field emission are discussed and various theories attempting to explain them are presented.",
keywords = "Building-up emitter process, Current-voltage characteristic, Electric field calculation, Electron energy distribution, Emission area, Field electron emission, Field emission of semiconductors, Field emission spectroscopy, Fowler–Nordheim plot, Nottingham effect, Phenomenological theory, Surface diffusion, Thermal-field emission, Work function",
author = "Nikolay Egorov and Evgeny Sheshin",
year = "2017",
month = jan,
day = "1",
doi = "10.1007/978-3-319-56561-3_3",
language = "English",
series = "Springer Series in Advanced Microelectronics",
publisher = "Springer Nature",
pages = "115--169",
booktitle = "Springer Series in Advanced Microelectronics",
address = "Germany",

}

RIS

TY - CHAP

T1 - Modern developments in theoretical research of field emission

AU - Egorov, Nikolay

AU - Sheshin, Evgeny

PY - 2017/1/1

Y1 - 2017/1/1

N2 - This chapter discusses modern developments in theoretical research of field emission from metals and semiconductors. Emitter shape approximation and methods of electrostatic potential and field strength calculation are considered. It also presents the theory of thermal-field emission (TFE) from metals. Energy distributions of field electrons and TFE electrons emitted from a metal are considered in terms of applications for field emission spectroscopy. Theoretical aspects of phenomena and processes on the emitter surface during field emission are discussed and various theories attempting to explain them are presented.

AB - This chapter discusses modern developments in theoretical research of field emission from metals and semiconductors. Emitter shape approximation and methods of electrostatic potential and field strength calculation are considered. It also presents the theory of thermal-field emission (TFE) from metals. Energy distributions of field electrons and TFE electrons emitted from a metal are considered in terms of applications for field emission spectroscopy. Theoretical aspects of phenomena and processes on the emitter surface during field emission are discussed and various theories attempting to explain them are presented.

KW - Building-up emitter process

KW - Current-voltage characteristic

KW - Electric field calculation

KW - Electron energy distribution

KW - Emission area

KW - Field electron emission

KW - Field emission of semiconductors

KW - Field emission spectroscopy

KW - Fowler–Nordheim plot

KW - Nottingham effect

KW - Phenomenological theory

KW - Surface diffusion

KW - Thermal-field emission

KW - Work function

UR - http://www.scopus.com/inward/record.url?scp=85020204089&partnerID=8YFLogxK

U2 - 10.1007/978-3-319-56561-3_3

DO - 10.1007/978-3-319-56561-3_3

M3 - Chapter

AN - SCOPUS:85020204089

T3 - Springer Series in Advanced Microelectronics

SP - 115

EP - 169

BT - Springer Series in Advanced Microelectronics

PB - Springer Nature

ER -

ID: 49549521