Результаты исследований: Материалы конференций › материалы › Рецензирование
Investigation of the excitation of ion beams in the explosive mode emission of semiconductors. / Denisov, V. P.; Egorov, N. V.; Prudnikov, A. P.
1996. 762-764 Работа представлена на Proceedings of the 1996 17th International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Part 1 (of 2), Berkeley, CA, USA.Результаты исследований: Материалы конференций › материалы › Рецензирование
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TY - CONF
T1 - Investigation of the excitation of ion beams in the explosive mode emission of semiconductors
AU - Denisov, V. P.
AU - Egorov, N. V.
AU - Prudnikov, A. P.
PY - 1996/1/1
Y1 - 1996/1/1
N2 - We investigated the possibility of ion beams production at the germanium and silicon tips with the micro- and millisecond pulses. The results of the experiments show that the semiconducting tips are promising for ion beams production. There are the modes of exploitation in which the reproducible amplitudes of the ion current pulses are obtained.
AB - We investigated the possibility of ion beams production at the germanium and silicon tips with the micro- and millisecond pulses. The results of the experiments show that the semiconducting tips are promising for ion beams production. There are the modes of exploitation in which the reproducible amplitudes of the ion current pulses are obtained.
UR - http://www.scopus.com/inward/record.url?scp=0029715019&partnerID=8YFLogxK
M3 - Paper
AN - SCOPUS:0029715019
SP - 762
EP - 764
T2 - Proceedings of the 1996 17th International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Part 1 (of 2)
Y2 - 21 July 1996 through 26 July 1996
ER -
ID: 49548504